ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, automation and analysis of embedded instrumentation.

Guided Fault Isolation

Guided Fault Isolation (GFI)

Guided Fault Isolation (GFI) de-skills the diagnosis of complex dead boards, cutting costs and improving repair quality.

Processor-Controlled Test's Guided Fault Isolation (GFI) simplifies fault diagnosis by indicating failing components on a block diagram of the board, as shown below. This example is for a PC-architecture board, but any architecture can be represented in a similar manner.

Each block is associated with any number of device-level tests when the board test is developed. If the block fails any of these device-level tests, it is highlighted in red and additional guidance is provided to the operator by a results window at the top of the PCT interface, as shown below.

Results Window - Diagnostics

A detailed description for each failure is provided. In this case data bus lines 7 and 10 are stuck high, and lines 27, 28, and 29 are stuck low or are open.