ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, auto­mation and analysis of embedded instrumentation.

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 PCT Overview

 PCT In Depth

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 Fast Functional Test

 Dead Board Debug

 Guided Fault Isolation

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Fast Functional Test

Fast Functional Test

Processor-Controlled Test (PCT) can provide a fast functional test prior to system-level test. Key components and buses are verified at an earlier stage in production, cutting costs.

 

Board Block Diagram

PCT's test sequence for the above board would check power, establish access to the CPU, take control of the CPU, and then instruct it to set up and perform tests on all addressable devices:

 

Board Block Diagram

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