ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, auto­mation and analysis of embedded instrumentation.

 ScanWorks Products

  Boundary-Scan Test (BST)

  Processor-Controlled Test (PCT)

  High-Speed I/O (HSIO)

  FPGA-Controlled Test (FCT)

ScanWorks® Platform for Embedded Instruments

Technology is advancing beyond the reach of external test and measurement equipment. Oscilloscopes and logic analyzers for validation, diagnostics and debug; in-circuit test, manufacturing defect analyzers, flying probe testers in manufacturing – all such external equipment has served its purpose admirably, but its time is passing.

Chips, circuit boards and systems are decades removed from the time when external testers were fully adequate for the requirements of the electronics industry. Now, tools are needed that work from the inside out instead of from the outside in. And that’s precisely what the ScanWorks platform for embedded instruments does.

A Platform for Embedded Instruments

ScanWorks capitalizes on the instrumentation that is routinely embedded by chip suppliers as well as the infrastructures that are designed into printed circuit boards by board designers. Users of ScanWorks can deploy any or all of the non-intrusive validation, test and debug product technologies that make up the ScanWorks platform. These include IEEE 1149.1 boundary-scan/JTAG test for structural shorts and opens testing, processor-controlled test (PCT) for at-speed functional test and board diagnostics, high-speed I/O (HSIO) validation tools based on built-in self test (BIST) technology, and FPGA-controlled test (FCT) which can incorporate any or all of the various ScanWorks product technologies into a board-tester-in-a-chip.

How the multiple product technologies that make up the ScanWorks platform are applied depends on the particular requirements you might have. Some test strategies might call for ScanWorks in volume manufacturing for board test; others could validate signal integrity in design; and still others might debug prototypes in board bring-up. Even complex chips like SoCs and 3D devices can take advantage of the product technologies that make up the ScanWorks platform for embedded instruments.

Where ScanWorks can help you

ScanWorks Products

Boundary-Scan Test (BST) - Structural shorts and opens testing and diagnostics (IEEE 1149.1/1149.6/1149.7)
Processor-Controlled Test (PCT) - Functional and at-speed test with diagnostics
High-Speed I/O (HSIO) - Verify signal integrity and conduct performance testing on high-speed buses
FPGA-Controlled Test (FCT) - Automatically insert a board tester in an FPGA and operate from a drag-and-drop user interface

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