ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.
This document summarizes a checklist of questions to assist testability assessment of a board mostly from a boundary-scan perspective but also from other test perspectives (ICT, FPT, AXI, AOI). The checklist is based on a set of Chip and Board Testability Guidelines, available from the author, also available.
Contents of document
1. Before you start
2. On-Board Devices Checklist
3. Board-Level Checklist
To
view this PDF document, select
here.
PRIVACY STATEMENT | CONTACT US | SITE MAP | RESOURCES
Copyright © 2001-2009 ASSET InterTech Inc. All rights reserved.