µMaster                  

Using ScanWorks and µMaster

Functional tests are created and validated in the µMaster user interface. The completed and verified tests are imported into ScanWorks as a CPU action. They then can be applied as a part of a complete JTAG-based test operation. In ScanWorks, the test developer selects the tests to be run on a particular board design and saves the selections. These actions might include CPU actions as well as other types of tests. CPU actions are applied from within ScanWorks like any other action. CPU actions can be run as stand-alone actions, they can be included in a sequence or they may be called by an API function that was defined by any of several popular test programming languages. When tests are applied, ScanWorks acts as a test executive, calling µMaster software when necessary and enabling the µMaster hardware to apply CPU actions without translating these actions into a ScanWorks format.

This ensures they are executed just as they were developed and validated. The test results are returned to ScanWorks and displayed in a ScanWorks Run Log. The results include PASS/FAIL as well as any diagnostic information available from µMaster.

Connecting to the Unit Under Test (UUT)

Both a ScanWorks boundary-scan controller card and a µMaster functional test controller card are required, as well as the appropriate interface pods for each. The interface pods are connected to the unit under test (UUT) to provide access to the scan path and CPU debug port. This access can be designed into the UUT in many ways. In some cases separate connectors are provided so each interface pod can be connected directly to its own on-board connector. In other cases, a single connector can provide access to both the scan path and the debug port. In this case, the two interface pods are electrically merged together so that only one physical connector is needed on the UUT. In either case, the proper controller card is automatically connected to the UUT whenever ScanWorks or µMaster tests are applied.

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