µMaster                            

Product Overview

The new ScanWorks Extended JTAG Coverage solutions from ASSET InterTech Inc. are the industry's first combination of standard boundary scan test with microprocessor emulation technology for extended test coverage. ScanWorks Extended JTAG Coverage incorporates the emulation-based functional test technology of µMaster (pronounced microMaster) from International Test Technologies.

Like ScanWorks, µMaster uses the JTAG port. µMaster tests the functionality of devices by taking control of an on-board processor to run functional tests on the board or system. ScanWorks uses the JTAG port to test the structural integrity of the board, and to load data into PLDs and flash memories. The two test methods are complementary. Each provides test coverage and features that the other doesn't. In some case, either method can be selected, depending upon which will be best for the application.

µMaster from International Test Technologies

International Test Technologies is the world leader in manufacturing test and debug solution for processor-based boards. Unlike other emulation tools that are used for design verification and firmware debug, µMaster products have been optimized for emulation-based functional tests in manufacturing, debug and repair. µMaster can help in the following ways:

• Quickly running full functional tests and replacing hot mock-up testing
• Improve test coverage when used with ICT, MDA or boundary scan by adding at-speed functional tests
• Overcome limited access and minimize board stress by using very few test points
• Simplify fault diagnostics with guided fault location even for non-booting boards
• Automatic ISP for flash programming using the on-board processor
• A built-in database utility for fault/fix logging and analysis

µMaster uses the BDM/COP/JTAG port on popular processors to access the internal registers that support emulation. After it has taken control of the processor, µMaster exercises the busses and components surrounding the processor by performing functional tests. Both structural and at-speed faults can be detected.

µMaster tools provide a complete test generation environment as well as run-time and debug and repair applications. For test generation µMaster includes built-in test routines with pre-programmed test libraries for CPU test pins, bus tests, Ram tests (SRAM, Cache, SDRAM, DDR SDRAM, etc.) and ROM tests (CRC and Checksum). It also includes built-in test routines for chips sets such as memory controllers, bus bridges, video controllers, LAN controllers, etc.

Automatic test generation is available for boards based on Intel® Pentium® processors. You can generate tests for busses, bridges, memory, and IO. A database for all common chipsets is provided via the International Test Technologies web site. A new boards configuration can be learned from a known good board and common chip set drivers can be automatically included in the tests. Other processors types are supported through a semi-automated test generation process where the user selects preprogrammed scripts from a built-in library. Like ScanWorks, custom or 3rd party interfaces and instruments can be easily integrated with µMaster. All Microsoft® Windows® -based test executives such as National Instruments™ TestStand™ are supported. µMaster low-level drivers can be accessed programmatically, using C, C++, Microsoft® Visual Basic®, Microsoft® Visual C++®, National Instruments™ CVI™, etc.

The ScanWorks Extended JTAG Coverage option includes the µMaster application development software tool kit specific to your processor family, and a Functional Test Controller Card and a Processor Control Pod to provide the electrical interface to the processor. A run-time only version is available for use with ScanWorks Manufacturing Stations. The IO Emulation Unit shown below is an additional optional feature.

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