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PRODUCTS

BSDL Services:
BSDL Validation Service
DFT Products:
DFT Analyzer™
ScanWorks®
Boundary-Scan Products:

Interconnect Development Station
Interconnect Repair Station
Test Development Station
Diagnostic & Repair Station
Manufacturing Station
Programming Stations
IEEE 1149.6
Emergency License Tokens
Hardware Overview

IBIST Products:
ScanWorks® Intel® IBIST
Emulation Products:
MicroMaster
ICT Products:
ScanWorks® for Agilent's Medalist ICT
Technology:
Test Automation
System-Level JTAG


 

ScanWorks® JTAG Test Development Station Bundle

Deployment to Manufacturing

Once tests have been created, they must be organized into a logical sequence for effective PCB testing. For prototype debugging and low volume applications, ScanWorks provides a simple operator user interface to control the application of test sequences. A sequence can be automatically generated from the test actions created for a design. Later, sequences can be modified to set flow control options or to change the order in which the tests are applied. ScanWorksAPI allows tests to be easily integrated into test executives generated by the most prevalent tool sets such as LabView, TestStand, Agilent Vee, Visual Basic, or any language that supports Microsoft COM. With ScanWorksAPI, you can create your own sequence of actions or apply a sequence that was previously created in ScanWorks. A Test Development Station can be used as a manufacturing station, but a more economical alternative would be to move the tests to the more cost-effective ScanWorks Manufacturing Station. The complete test set-up can be moved to manufacturing by exporting a single compressed file containing all the data needed for testing and then importing this file onto a manufacturing station.

 

Diagnosing Defects

Finding defects is only half the battle. You must also be able to isolate the defect to be able to fix it and return the PCB to the manufacturing process. A ScanWorks Test Development Station includes several features that help isolate defects, including pin-level diagnostic reports and a test results window, which displays test results vector by vector. ScanWorks’ Graphical Fault Highlighting helps pinpoint the likely location of a defect by linking fault reports to a graphical view of the board layout or schematic. The ScanWorks Debugger and Scan Analyzer interactively control scan operations at level of a boundary-scan cell or register. These features also can generate a waveform view of the test results.

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