ScanWorks® PCI-410 Four Port JTAG Controller

Multiple Board or Scan Path Support

The PCI-410 supports test and programming of more than one board through a unique interface that combines boundary-scan TAP signals and non-boundary-scan Discrete IO (DIO) signals in a single test port for easy interface to your UUT. Each of the four test ports includes the five standard IEEE 1149.1 signals, four DIO signals, and a ground for each signal. The four DIO signals can function as either inputs or outputs. However, two of the non-boundary scan signals are optimized to support fast switching operations by software selectable termination configurations. The other two are general-purpose input/output functions intended for static signal control. Refer to the DIO section of this document for details.

Tests are created for application to multiple UUTs exactly the same way they are created for individual application. An interface, Figure 2, is provided to select the active test port(s) when tests are applied. Active ports can be selected during test development and transferred to a manufacturing station, or selected on the manufacturing station. ScanWorks manages the results data to make sure the operator knows which UUT passes or fails and to save the results individually for each UUT.

Programmable Test Clock

The TCK signal provided by the PCI-410 controller card is programmable from 160 kHz to 50 MHz in increments to allow you to select a TCK frequency to optimize the throughput for the maximum capabilities of your UUT. Table 1 lists the frequencies available. During scan operations, the throughput is virtually identical to the TCK frequency (50 MHz —50 Mbit/second).

The TCK frequency can be selected from the hardware configuration menu to set the default frequency. It can also be set within actions that generate scan operations to allow optimization for that action. This allows the maximum frequency to be used for all operations except those that require a lower frequency such as some PLD programming operations. The frequency can also be controlled with the FREQUENCY statements in SVF or STAPL files and from ScanWorks APIs.

The PCI-410 TCK signals runs continuously except when it is necessary to re-load the TDI/TDO data FIFOs during a shift operation. This feature enables the PCI-410 to support devices that do not comply with the IEEE 1149.1 standard and cannot enter the PAUSE state during a shift operation as well as conditions when TCK must continue to run.

Discrete I/O Signals

The PCI-410 supports 20 non-boundary-scan discrete IO (DIO) signals to control and observe non-boundary-scan signals on your UUT. Each of these signals exhibits low impedance as outputs and high impedance as inputs. Each test port includes four DIO signals that are set to a common voltage level. One is optimized for use in controlling the write enable signal of flash memory by software selectable electrical characteristics that provide either very low impedance or nominally high impedance (series resistor terminated). A second signal is optimized for observing the state of the Ready/Busy signal from flash memories in that it has a mid-range AC impedance (AC-parallel termination). A separate connector provides an additional four DIO signals that can be used as general purpose IO signals. The voltage level of each of these signals can be set separately. The state of all DIO signals can be controlled and observed in a DIO action, by using the ASSET macro language, or from ScanWorks interactive applications such as the debugger.

UUT Interface

The PCI-410 supports UUT interface voltages of 1.8V, 2.5V, 3.3V (5.0V tolerant), and 5V TTL. The voltage is software selectable for each set of TAP signals, each set of DIO signals associated with a test port, and for each general purpose DIO signal. Series termination of each TCK and TMS signal is optional with a software selectable series resistor. TDO is a high impedance input and TDI is not terminated. General purpose DIO signals are considered static signals and not terminated. See the PCI-410 on-line documentation for complete specifications.

Physical Features

The PCI-410 controller card and pod are built to commercial environmental standards for the U.S. and Europe. The pod is EMI shielded to eliminate noise in a laboratory or manufacturing environment. Cables are also shielded and provide a ground wire for each signal wire when possible. The PCI-410 documentation has complete specifications.

Prototype Debug to Manufacturing

During the design/debug stage of your product’s life cycle, the PCI-410 controller card provides you with a robust and flexible interface from your host test platform to your board. It provides maximum scan throughput to even the most highly optimized scan paths. During manufacturing it provides a cost effective cost-per-test port ratio for high volume production. The PCI-410 controller is functionally and electrically equivalent to the hardware used in the Agilent 3070 ScanWorks option. By using the same controller in design/debug test development and manufacturing, you eliminate any question of compatibility.

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