ScanWorks® JTAG Diagnostic & Repair Station Bundle

Process Automation Scripting API

Process Automation Scripting is a very powerful tool with many applications. It supports custom test generation by providing access to all of the boundary scan features on any device that is accessible to ScanWorks. Test patterns can be applied and the results observed at any level of the design, from specific scan cells to nets at the board or system level. Any test programming language can be used to create these tests, including languages that supports Microsoft’s Component Object Model (COM), Tcl, Perl, Visual Basic, C, C# and C++. Process Automation Scripting is especially useful during prototype debug and board repair with a Diagnostic & Repair Station because it enables you to control the state of the UUT while probing with traditional test instruments such as volt meters, oscilloscopes, and logic analyzers. You can set static values on pins or create loop tests to toggle pins while tracing them on the board. And it can all be done using your favorite test programming language.

Graphical Fault Highlighting

The Graphical Fault Highlighting feature gives you access to a graphical view of the board layout using the powerful InterComm Design Browser from PTC (formerly OHIO Design). Interconnect test and Memory Access Verification test reports are linked to the layout view by clicking on a pin or net in the report. Cross hairs pinpoint the location of the pin or net in the layout view where the Design Browser gives you access to all the available information about that pin, and shows you the exact routing of the net connected to that pin. You can easily locate the suspected pin on the actual board being tested and quickly inspect it for obvious defects. You can cross-highlight the layout view to a schematic view to see the functional logic associated with the pin. The InterComm Design Browser is provided by PTC. Additional information about the InterComm Design Browser is available at: InterComm on PTC Web Site.

Interactive Debugger/Scan Analyzer

The Debugger/Scan Analyzer feature gives you powerful tools to debug tests created with macros or as SVF files. The debugger gives you access to boundary-scan cells and registers, from the device, board or system level. You control when the scan operations occur, the values shifted in and can observe the results shifted out in either a register view or a pin view. You can single-step macro programs or SVF files to see the results of each scan. The Scan Analyzer provides either a waveform or a state table view of the execution of a macro program or SVF file. Any miscompares are highlighted, enabling you to see exactly what lead up to the miscompares.

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