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BSDL Services:
BSDL Validation Service
DFT Products:
DFT Analyzer™
ScanWorks®
Boundary-Scan Products:

Interconnect Development Station
Interconnect Repair Station
Test Development Station
Diagnostic & Repair Station
Manufacturing Station
Programming Stations
IEEE 1149.6
Emergency License Tokens
Hardware Overview

IBIST Products:
ScanWorks® Intel® IBIST
Emulation Products:
MicroMaster
ICT Products:
ScanWorks® for Agilent's Medalist ICT
Technology:
Test Automation
System-Level JTAG


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ScanWorks® JTAG Diagnostic & Repair Station Bundle

Product Overview

ScanWorks Diagnostic & Repair Station provides all the features necessary to quickly and easily diagnose and repair defects detected on boards during manufacturing. A separate repair station allows your development and manufacturing operations to continue uninterrupted while boards are repaired off-line. The Diagnostic & Repair Station provides access to the built-in debug features of each test type but restricts the ability to modify designs or regenerate ScanWorks tests, protecting the integrity of the ScanWorks projects. Several of the major benefits of the Diagnostic & Repair Station are:

  • Project Management — Import and run the same tests used in manufacturing, using either the ScanWorks sequencer or a custom user interface
  • Comprehensive test application — Apply and diagnose any test created with an Test Development Station, including PLD and flash memory programming
  • Consistent, intuitive user interface — Uses the same basic user interface as the Test Development Station
  • Maintain test integrity — By limiting access to test generation tools, you maintain safety of test and are assured the same tests are used for debug as were used for detection in manufacturing
  • Quick defect isolation with pin-level diagnostics for interconnect test — Pin-level diagnostics to isolate a defect to the most likely device pin are included
  • Graphical views of the board layout and schematic are linked directly from the fault reports, enabling you to quickly pin point the most likely location of the defect

Diagnostic & Repair Station includes features like the design manager, scan path verification, pin-level diagnostics for interconnect tests, test results windows for each test type, graphical fault highlighting, and the test sequencer. You also have access to the interactive debugger and scan analyzer, and macros to create custom tests to control and observe specific device pins to isolate defects.

Design Management

ScanWorks design management provides features needed to link your Diagnostic and Repair Station with a Test Development Station or a Manufacturing Station. The design management software features allow you to:

  • Organize and manage your design, test, and programming data
  • Import manufacturing tests as one compressed file
  • Use a simple test executive to run manufacturing test and programming applications or use the same operator interface used in production
  • Run tests exactly as they were run when the faults were detected during production testing.

Organizing and Managing your Design and Test Data

The design management software enables you to keep all the design and test data associated with a design together. Similar designs can be kept together in project folders. Projects and/or designs can be easily imported from any ScanWorks development station, manufacturing station, or from an Agilent ScanWorks for the 3070 installation as a single compressed file. This eases the process of transferring to the diagnostic and repair function and ensures that all files needed are available.

All test or programming operations are implemented as actions. An action encapsulates all the information needed to run a test and diagnose the results. Actions can be executed individually or organized into sequences. A sequence can be executed in a batch mode. The design management software includes the Sequencer, a simple test executive that enables you to run sequences of actions. All actions and sequences can be exported as part of the design or project when moving to diagnostic and repair from development or from a manufacturing Station. The exported information includes the test results files that indicated the detected faults for review during the repair process.

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