ScanWorks^® JTAG Interactive Debugger and Scan Analyzer

Scan Analyzer

The scan analyzer displays boundary-scan data in a manner similar to traditional logic analyzers with both a waveform display and a state table display. The application of a series of scan operations is shown on a scan-by-scan basis, enabling you to view the effect of each scan on subsequent operations. Scan analyzer is primarily used to validate that custom tests are operating as designed and to diagnose faults found during manufacturing tests.

With the scan analyzer, you select the test to be applied, the registers or buses to be viewed and how much data to collect. You also can control when the test is applied. The tests to be applied can be a random sample of data during normal operation, a macro test or an SVF test. A random sampling test allows you to monitor specific signals during normal operation to see if they are toggling. The samples have no real-time relationship. With macros and SVF tests, you see the sequence of scan operations that were applied. With this information, you can easily determine whether the tests vectors are exercising the design correctly or if a physical fault is causing miscompare.

In both the waveform and state table views, you can select the registers and buses you need to interrogate and then select the scan data appropriate for your needs. Each scan register and bus has three sets of data associated with it: data shifted in, data shifted out and data expected to be shifted out. The data needed for analysis is specific to each application and can be individually selected for viewing. You select the number of scans and set the trigger point when data collection starts. In most cases, you simply collect all data because most scan tests are fairly short. Other features to ease analysis include:

• Miscompares are highlighted in contrasting colors
• Symbolic values for common data patterns are defined within scan analyzer
• Data is displayed in binary, hexadecimal or decimal format
• Cursor and markers identify specific scans
• The previous set-up is saved between sessions
• State table and waveform views are synchronized

Previous : Next                   Page 2 of 2