ScanWorks^® JTAG Interactive Debugger and Scan Analyzer

Product Overview

Boundary-scan or JTAG technology provides virtual access to test the structural integrity of printed circuit boards (PCB) where boards are inaccessible with traditional test methods such as oscilloscopes, logic analyzers and in-circuit testers. However, without the proper tools to control and observe the results of boundary-scan tests, their full potential cannot be realized. The interactive debug and analysis tools of ScanWorks put you in the driver’s seat. You control and observe scannable signals at the device pin, scan register or bus level and you have access at the device, board and system levels. These features are especially useful when repairing boards that have failed manufacturing tests or when creating custom tests. Repair of otherwise non-repairable boards increases manufacturing yields by reducing the number of board that must be scrapped. Custom tests created with ScanWorks’ macros or C++ can increase fault coverage and increase the quality of shipped boards.

Two features are provided to support these capabilities. Interactive debug and analyze capabilities are available from the ScanWorks design manager user interface. When access to either capability is initiated, both the debug and scan analyze capabilities are started and the status of the ScanWorks station is restored to the state when it last used these features.

Interative Debugger

The interactive debugger gives you full control of the boundary-scan features o the unit under test (UUT). You can control when scan operations are done and when data is scanned into the UUT. You can also observe data as it is scanned out, enabling extensive analysis of the scan results.

The interactive debugger provides two views of the boundary-scan features of the UUT — scan view and pin view. Scan view enables you to control and observe data for all scan-accessible registers in a device and control and observe any bus that has been defined at the device, board or system level. With pin view you control and observe the data at the device pins and the instruction register. With both views, you can select the device, board or system from a hierarchical view of the design. You set the data to be scanned in, initiate the scan operation and observe data scanned out. Scan data is maintained from scan to scan and does not need to be specified again unless it changes. You can also apply macro and serial vector format (SVF) tests while observing the application in single-step mode to debug and analyze test effectiveness. Other features include:

• Interactive scan operations can be recorded as an SVF file
• Registers and buses can be grouped into application-specific sets for easier viewing
• Set up data can be saved from one session to the next
• Symbolic values can be used for common data patterns
• Actual response can be compared with expected response

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