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ScanWorks wins "Best In Test" for third year in a row!

New controller is first to perform both JTAG and functional emulation testing

ASSET and Firecron demonstrate system-level JTAG proof-of-concept

 
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Featured Story

ASSET commits to developing open embedded instrumentation tools for Internal JTAG (IJTAG) standard

April 29, 2008 –ASSET® InterTech Inc. is developing and will bring to market open embedded instrumentation tools based on the preliminary IEEE standard, P1687 Internal JTAG (IJTAG). According to Glenn Woppman, president and CEO of ASSET, the standard is close enough to ratification to begin developing tools.

"Electronics manufacturers are realizing that the external design validation, test and debug technologies which they have now are simply running out of gas," said Woppman. "As a result, chip vendors as well as the system manufacturers themselves are embedding instruments into silicon. Now, both the chip vendors and system suppliers need open tools to work with these embedded instruments. For the sake of efficiency and agility, these tools must be able to manage embedded instruments from any chip vendor. This is where the IJTAG standard comes in."

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Press Releases   ASSET In The News

April 17, 2008 - TRI integrates ASSET®’s ScanWorks® boundary-scan technology into its test systems

April 1, 2008 - ASSET® is first to support Intel®’s new Atom™ processor with CPU emulation test and diagnostics

Dec, 3, 2007 - ASSET® InterTech Acquires International Test Technologies

October 23, 2007 - ASSET expands next-generation embedded instrumentation

August 21, 2007 - ASSET® and Agilent Technologies integration of in-circuit and JTAG test delivers cost competitive, high quality solution

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Maximizing test coverage with boundary scan

DesignVision Award Finalist 2007

DFT Lab opens in Silicon Valley

New ScanWorks controller for JTAG and functional test

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Boundary Scan Skews Test Coverage
Tradeoffs in your Favor

BestTest e-newsletter, (Volume 11 Number 10, May 16, 2007)

Design-for-Test Tool Would Ensure
Maximum Benefit from JTAG

BestTest e-newsletter, (Volume 11 Number 9, May 1, 2007)

"Glenn Woppman describes the new
IJTAG and SJTAG initiatives at ITC"

Test & Measurement World (October 2006)

"Expanded Role for JTAG DFT"
Evaluation Engineering (October 2006)

"Tackling tough problems"
Embedded System Engineering (Sept. 2005)

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More than just a pretty face… Usability? Take Microsoft’s word for it

Embedded test structures are critical to validating and testing designs with high-speed buses

Fitting in by standing out: A closer look at assembly test

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Frequently Asked Questions (FAQ): Embedded Instrumentation – The future of advanced design validation, test and debug

Media Fact Sheet – Embedded Instrumentation Gains Broad Traction Across the Electronics Industry

Media Fact Sheet – Embedded Instrumentation Comes in Many Shapes, Sizes and Flavors

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ITC 2007
Santa Clara, CA
October 23-25, 2007

Productronica 2007
Munich, Germany
November 13-16, 2007

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