Discover a World of Boundary Scan & JTAG Benefits

Do you wish that you had the ability to debug your prototype and pinpoint defects earlier in the design stage? Have you ever wanted precise fault data during manufacturing that could be incorporated into process improvements? Would you like the flexibility to perform in-system programming of logic and flash devices to expedite production and decrease inventory? Do you want a way to dramatically reduce no-fault-found problems - where the board fails in the field, but works at the repair station? JTAG, or as it is known by its official name, IEEE 1149.1 boundary scan, is your answer.

The underlying purpose of JTAG or boundary scan technology is to enable engineers to overcome the limited access challenges of today's complex boards by providing virtual access to the board. But the best thing about the IEEE 1149.1 boundary scan standard is the enormous business benefits it delivers.

Reduced time to market. Reduced risk. Increased quality. Decreased defects. Increased productivity. Lower inventory levels. Less waste and board damage. The convenience of reprogramming without disassembling boards. The expediency of reusing the same 1149.1 tests from design to manufacturing and repair. In addition to saving costs by not requiring fixtures, JTAG / boundary scan tests can be executed on a low-cost PC platform.

Boundary scan technology gives you the power to create these benefits and more. And ASSET's boundary scan environment, ScanWorks, gives you access to everything you need to make it happen.

To speak with an ASSET representative, click here.

Debug and Test Boards due to loss of physical access

JTAG was developed to address the "loss of physical access" problems. more info »

Test BGAs

BGA's give designers the capability to put even more functionality into an even smaller area. However, when these designs flow through the rest of the product development process, three problems typically arise.
more info »

High Density Boards

Today, printed circuit boards are getting smaller and smaller and are becoming more and more densely populated. When these designs flow through the life-cycle of the development process, three problems quickly become apparent. more info »

Test Development

New packaging technologies and lack of space on the boards cause test points to become an unaffordable luxury. more info »

Flash Programming

Prototype debugging using programmable devices can be a challenge due to re-programming of the devices many times during the processor code development. more info »

CPLD/FPGA Programming

Programming multiple programmable devices on a board using one tool and one method is a challenge. more info »

Prototype Design & Debug

Testing for solder smears, bridges and gaps, plus misplaced and defective parts is a challenge in prototype debug. more info »

Manufacturing Test

Assembly test, functional test and environmental chamber testing can all be enhanced through boundary scan testing. more info »

Field Test & Repair

Testing field returns quickly. more info »