ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, automation and analysis of embedded instrumentation.
The ScanWorks® Graphical Fault Highlighting is a powerful, yet easy-to-use collaboration and communications tool that gives engineers, manufacturers and customers’ web-based access to electronic design data. The data is accessible for browsing graphically as either a printed circuit board layout or a schematic. The graphical fault highlighting tool provides the ability to visually pinpoint fault locations on a layout view and to view the fault coverage provided by the current set of boundary-scan tests. After running test actions, the fault location can be viewed by clicking the net name or pin number in the ScanWorks Net Failures Report or Advanced Diagnostics Report. Cross hairs pinpoint the fault location.
In addition, selecting a device or pin allows you to view its properties or display the relevant part of the scan path. The fault coverage is viewed by generating a combined coverage report and clicking on the provided links. A link is provided to display the interconnect fault coverage report which contains links to display all the nets in each of the six coverage classes, from fully covered to no coverage. The combined coverage report includes links to display the opens coverage at the device and pin level. All fully covered devices (all pins covered) and all devices with no coverage can be displayed, as well as any partially covered device with the covered pins highlighted.
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