RIC-1000 Single-Port Remote Instrumentation Controller

The first member of the RIC family is the high-performance RIC-1000. This compact and cost-effective controller is extremely versatile. It is capable of high-speed test application and has significant on-board memory space for storing tests, test results and application data. The RIC-1000 supports an auto sensing 10/100/1000 CAT5E/6 Ethernet interface and its voltage levels and test clock (TCK) speeds are programmable. It features simple cable connections and its compact size makes it easily embeddable into testers or onto test fixtures. Pin-level diagnostics are supported as well as a wide variety of test types and programming algorithms.

Some of the features of the RIC-1000 include the following:

• Ethernet interface –10/100/1000 megabits per second (Mbps) speeds
• Voltage levels –Programmable from 1.2V to 3.3V
• Test clock speeds –Programmable from 160 KHz to 50 MHz
• Discrete I/O –Eight additional non-boundary scan signals supported
• Rugged enclosure –Protection from EMI and harsh environmental conditions
• IP Addressable –An IP address can be assigned by the user
• Significant Storage –256 MB of on-board memory for test programs, test application data, and test results

RIC-4000 Multi-Tap Remote Instrumentation Controller

The Remote Instrumentation Controller (RIC) provides an extremely flexible interface for communication between your ScanWorks® platform and your unit under test (UUT). It supports auto sensing Ethernet and connects directly to your UUT. The RIC-4000 controller will be setup with an IP-address of your choice to make it available on your network. With the proper network connections and permissions, you can sit at your desk and control operations on a UUT anyplace in the world.

PCI-410 Multiport Boundary Scan Controller

The PCI Multiport Boundary-Scan Controller (PCI-410) is a high throughput, flexible JTAG controller designed for a high-volume manufacturing environment. The PCI Multiport Boundary-Scan Controller requires a Four-Port Boundary-Scan Interface Pod to connect to the UUT. The pod can be up to 50 feet from the controller card and still support the maximum TCK frequency of 50 MHz. The PCI Multiport Boundary-Scan Controller can support two Four-Port Boundary-Scan Interface Pods and as many as three PCI Multiport Boundary-Scan Controllers can be installed in one PC. In a maximum configuration, one test platform can connect to as many as 24 JTAG scan paths (2 x 4 x 3 = 24). ScanWorks provides the software to easily manage multiple scan paths.

Because the PCI Multiport Boundary-Scan Controller is embedded in the ScanWorks for Agilent Medalist 3070 or i5000 in-circuit test (ICT) system, the transition from development to ICT systems in manufacturing is quite seamless.

Boundary-Scan Test PCI-200EJ Hardware Kit

The BST PCI-200EJ controller with the boundary-scan pod supports the application of structural tests, programming operations and tests created with ScanWorks® Boundary-Scan Test. Examples of structural tests (shorts and opens testing) are scan path verification, interconnect tests, and memory access tests. Programming operations include flash programming, PLD configuration, and programming with I2C or SPI. Using the PCI-200EJ enables the application of all these scan operations with one boundary–scan controller and one connection to the unit under test.

The PCI-200EJ boundary-scan controller is installed in an available PCI slot in the PC on which ScanWorks is running. The PCI-200EJ uses a boundary-scan pod to connect to the UUT.

The PCI-200EJ provides a sustained data throughput at high TCK frequencies. This allows very fast structural test and in-system programming application times. The PCI-200EJ supports one boundary-scan pod with TCK frequencies ranging from 1 MHz to 20 MHz. The PCI-200EJ supports a controller-to-board distance of 3 feet between the controller card and the boundary-scan pod.

PCI-110 Low-Voltage Differential Signaling (LVDS) Controller

The PCI-110 LVDS controller (Low-voltage differential signaling) supports the application of structural tests, programming operations and tests created with ScanWorks® Boundary-Scan Test (BST). Examples of structural tests (shorts and opens testing) are scan path verification, interconnect tests, and memory access tests. Programming operations include flash programming, PLD configuration, and programming I2C or SPI devices. Using the PCI-110 LVDS enables the application of all these scan operations with one boundary-scan controller and one connection to the UUT (unit under test).

Its special TAP interface (TDI, TDO, TMS, TCK, and TRST) is based on LVDS signals and built for UUT’s, or interface boards, with a differential TAP interface. Figure 1 shows an example connection to a UUT. The controller is installed in a PCI slot in the PC on which ScanWorks is running. The PCI-110 LVDS connects directly to the UUT. LVDS allows tests to be run at higher speed and over longer distances. The PCI-110 LVDS provides a sustained data throughput at high TCK frequencies allowing very fast structural test and in-system configuration application times.

USB-100 Portable Boundary Scan Controller

The USB-100 Boundary-Scan Controller is a low-cost, easy-to-use and portable hardware interface for ScanWorks® and a unit under test (UUT). The USB-100 can be easily moved from ScanWorks stations in an office to the lab, or it can be used in field service applications where it interfaces a laptop computer to installed systems. Instead of being installed in an internal slot or bay, the USB-100 simply plugs into a USB port on the PC where ScanWorks is running. The USB-100 is based on the USB 2.0 specification that has a much higher throughput rate than USB 1.1. USB 1.1 is supported, but not recommended for most applications.

The compact USB-100 is about the size of a deck of playing cards. Standard, off-the-shelf USB 2.0 mini-B cable connects the USB-100 to a PC, making it easy to transport and connect. A large pod is not needed to connect ScanWorks to a UUT in the field or in manufacturing environments.

Teradyne's Di-Series Hardware

ScanWorks’ Boundary-Scan Test tools support Teradyne’s Di-Series hardware for board test and programming operations. All tests developed under ScanWorks can be executed on any Di-Series VXI instrument configured in a Teradyne test system. ScanWorks’ extensive boundary-scan test and device programming tools can be utilized in large-scale military/aerospace ATE systems like Teradyne’s Spectrum 9100, Lockheed Martin LM-STAR™ and others where Di-Series instruments are extensively deployed. Any of the digital I/O channels on a Di-Series instrument can function as boundary-scan’s Test Access Port (TAP) signals. The powerful combination of ScanWorks Boundary-Scan and the Teradyne Di-Series allows for very cost-effective, maintenance-friendly and streamlined test and fixture development. Di-Series hardware is sold and maintained by Teradyne. ScanWorks is licensed and maintained by ASSET.