ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

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Media Contacts:
Bob Greenfield
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(972) 254-2887
bob.greenfield@verizon.net

UPCOMING EVENTS

ASSET InterTech, Inc. invites you to visit us at any one of the below exhibits to learn about ScanWorks® for Embedded Instrumentation for boundary-scan test, processor-controlled test, Intel® Interconnect BIST (IBIST) and Core Instrumentation (IJTAG).

 

SEMINARS, TRADESHOWS OR EVENTS

Date:	Event:
September 10-12, 2012	Autotestcon Anaheim, CA
September 2012	IDF (Intel Developers Forum) San Francisco, CA
November 2012	ITC (International Test Conference) Anaheim, CA