The test development services provided by EDFT Services, ASSET InterTech's engineering services division, streamline the design and generation of boundary-scan tests and in-system programming (ISP) routines, reducing a new product's time-to-market and hastening revenue generation.

EDFT's offers a range of test development services so that a client can maintain a high level of cost efficiency by selecting the particular test development services needed for each design. EDFT can support the customer with services beginning early in the design stage and continuing through assembly and manufacturing. The customer achieves a high return on its investment in boundary-scan tests and programming routines because EDFT ensures a maximum of test re-use throughout the design, development and manufacturing processes.

Some of EDFT's test development services are listed below:

• System-Level Testing
• Memory Cluster Testing
• ASIC Testing - including memory built-in-self-test (BIST) and at-speed testing
• Multi-Board and Milti-System Simultaneous Testing
• HALT and HASS Testing
• Device Programming
• Migration from Design to Manufacturing to Ensure Maximumm Test Re-Use on In-circuit Test (ICT) and other Test Systems
• Field Service Implementation
• Embedded Test
• Partial and Full Integration of Boundary Scan
• Board-Level Interconnect Test