eResources

Arranged by category – Software Debug, Chip Debug, Hardware Validation, Manufacturing Test and Videos – these are some of our trending eBooks and videos. But there’s more, much more. Our experts are constantly working on new resources to help you. Click on the “More” buttons in each category to take a deeper dive.

Software Debug

Intel Trace Hub | Faster Software Debug | Finding Root Cause

Intel Trace Hub | Faster Software Debug | Finding Root Cause

Intel®’s Trace Hub has arrived in the nick of time for faster software debug. Code bases, including UEFI firmware, have gotten so large and so complex that just navigating through instruction trace... more
Trace Accelerates Debug Analysis in Complex Linux Systems

Trace Accelerates Debug Analysis in Complex Linux Systems

The system crashes and after hours and hours – stretching into days and weeks – you think you’ve debugged the software. Turns out, that nasty bug wasn’t where you thought it was. Usually, with... more
UEFI Framework Debugging | SourcePoint

UEFI Framework Debugging | SourcePoint

Spending too much time trying to navigate the growing UEFI code base or debugging UEFI code after you have inserted your module? UEFI code base is growing to take advantages of the latest silicon... more
Hardware-Assisted Debug and Trace within the Silicon

Hardware-Assisted Debug and Trace within the Silicon

Software debug has changed dramatically and for the better, especially with Intel’s introduction of new trace IP in its silicon and ARM’s enhanced trace macrocells. Legacy debug methods with printf... more

Chip Debug

IJTAG vs JTAG vs IEEE 1500 ECT | Technical Tutorial - Second Edition

IJTAG vs JTAG vs IEEE 1500 ECT | Technical Tutorial - Second Edition

Technology changes over time. Along the way, industry standards must change to keep up with technology. It should come as no surprise that since 1990, when the IEEE 1149.1 Boundary-Scan Standard (... more
IEEE 1687 IJTAG | The Future of Embedded Instruments

IEEE 1687 IJTAG | The Future of Embedded Instruments

Accessing and operating embedded instrument IP has not been easy. In fact, it’s been a challenge. But the recently ratified IEEE 1687 Internal JTAG (IJTAG) standard for embedded instruments is... more
Mixing Embedded eTAPs | 1149.1, IJTAG, Software Debug

Mixing Embedded eTAPs | 1149.1, IJTAG, Software Debug

What happens when you’re mixing multiple embedded TAPs – eTAPs? Like when TAPs for IEEE 1149.1 boundary scan, JTAG software debug ports (ARM DAP, Intel ITP) and IJTAG instruments are all in the same... more
IJTAG vs JTAG vs IEEE 1500 ECT | Introduction Tutorial

IJTAG vs JTAG vs IEEE 1500 ECT | Introduction Tutorial

Why so many standards? For instance, why IJTAG, JTAG and 1500 ECT for embedded instruments? The answer is simple: standards overlap because technology overlaps. This eBook tutorial – the first in our... more

Hardware Validation

Data Mining Analytics for Serdes | HSIO Validation

Data Mining Analytics for Serdes | HSIO Validation

One-shot pass/fail validation testing won’t quantify the risk of faults on serdes and high-speed I/O (HSIO) buses, but data mining with statistical analytic tools will. In fact, you’ll see how close... more
System Marginality Validation DDR Memory and Serial I/O

System Marginality Validation DDR Memory and Serial I/O

Designing sufficient operating margins into today’s high-speed printed circuit boards has become a very tough job. Especially challenging are those high-speed serial I/O and DDR3|DDR4 memory buses.... more
Detection and Diagnosis of Printed Circuit Board Defects and Variances

Detection and Diagnosis of Printed Circuit Board Defects and Variances

Boards and chips keep getting denser, faster. And the speed is higher so they’re a whole lot more sensitive. Slight variances or defects cause intermittent crashes and performance degradation. And... more
High-Speed Non-Intrusive Board Test | PCIe, QPI

High-Speed Non-Intrusive Board Test | PCIe, QPI

Remember test pads? Small contact points on a board’s interconnect buses with physical access for test purposes? No more. Or at least not for high-speed serial interconnects like PCI Express, Fibre... more

Manufacturing Test

Memory Fault Insertion and Detection of Intel 4th Generation Core Family

Memory Fault Insertion and Detection of Intel 4th Generation Core Family

In the paper, faults are inserted on an Intel® Shark Bay platform, and the ScanWorks® Processor-Controlled Test product is used to detect a myriad of faults. Real life examples always provide for... more
Increasing Test Coverage on Current Intel Platforms

Increasing Test Coverage on Current Intel Platforms

Testing platforms designed with Intel® Architectures (IA) can be extremely difficult. Some developers reuse the production BIOS to configure the platform for test, to simplify the task with good... more
Testing Memories without BIOS on the Latest Intel® Platforms

Testing Memories without BIOS on the Latest Intel® Platforms

Testing platforms designed with Intel® Architectures (IA) can be extremely difficult and testing memories near impossible. If you are still using a production BIOS to configure your memory subsystem... more
Faster Flash Programming via FPGA and IJTAG

Faster Flash Programming via FPGA and IJTAG

With tremendous growth in capacity, programming NOR and NAND flash memories at full functional speed is a must. But how? Here are the ins and outs on using an onboard FPGA and IJTAG, the IEEE 1687... more