CONNECT - May 2008

• Introducing the NEW ASSET InterTech
• Engineers keep an eye on signal integrity issues
• ASSET commits to IJTAG tools development
• ScanWorks controller is first to support three types of embedded instrumentation
• Reducing stress on components improves system reliability
• ASSET® Joins Mentor OpenDoor Program to ensure JTAG interoperability
• Osborn dispels confusion over processor emulation
• A contemporary allegory: Chip learns a lesson from Mr. PCB

CONNECT - February 2008

• Converging technologies prompt merger of ASSET and ITT
• MicroMaster delivers extensive test coverage
• Test company puts ScanWorks to the test
• ASSET acquires International Test Technologies
• ScanWorks boosts its support for Intel®'s embedded instruments
• Survey drawing winner finds test development fast and easy with ScanWorks
• Fenton sees bright future following ASSET and ITT merger
• Activity Analyzer can optimize use of ScanWorks licenses

CONNECT - October 2007

• Looking back and seeing the future
• BGAs are a tough nut to crack (and diagnose)
• Agilent and ASSET extend strategic collaboration
• Nortel jumps on the hosted license server bandwagon
• ITC will keep ASSET people hopping
• PICMG's® ATCA® considers boundary scan
• New JTAG switching device targets PICMG systems
• Speed is of the essence. And diagnostic tools!

CONNECT - August 2007

• “Maximizing Test Coverage” strikes a chord
• Dotting your “i’s” not enough. Validate your 1149.1!
• TelStrat turns to ScanWorks for complex device testing
• Embedded instruments link boundary scan to innovative design validation technologies
• Test Coverage webcast draws interesting responses from participants
• IJTAG working group passes first milestone
• And the winner of the Bose headphones is…

CONNECT - April 2007

• New DFT Labs fill a void in marketplace
• ROI makes boundary scan a good fit for anyone’s budget
• Standards development benefits entire industry
• ScanWorks’ External I/O Management increases test coverage
• DFT Analyzer named one of three finalists in prestigious DesignVision Awards
• New Boundary Scan Tutorial features expanded content
• New video explores ASSET’s role in the emergence of boundary scan
• Survey shows best-in-class user satisfaction for ScanWorks
• Discover the rewards of Scan Path Discovery
• Boundary scan emerges as a prime test and validation method for high-speed serial buses
  

CONNECT - October 2006

• More than just a pretty face… Usability? Take Microsoft’s word for it.
• Embedded test structures are critical to validating and testing designs
  with high-speed buses.
• Fitting in by standing out: A closer look at assembly test
• ASSET presents one paper, co-authors another at ITC
• IJTAG standard making progress – Demo scheduled for
  International Test Conference
• Remote embedded system JTAG demonstrated at ITC
• New ScanWorks controller combines boundary-scan and
  functional emulation testing
• BSDL validation accelerates introduction of “dot-6” devices
• ASSET opens Boundary Scan Technology Center in Malaysia
• New features enhance openness of ScanWorks

CONNECT - May 2006

• Telecom turning to boundary scan
• MicroTCA spec close to standardizing on boundary scan
• New ScanWorks helps reduce ICT test points, cuts fixture costs
• BSDL files can validate a chip’s JTAG implementation
• Boundary-Scan Technology Center opens in China
• Streamlining JTAG testability accelerates tool’s return-on- investment
• ASSET explains automated, rules-based JTAG DFT at
  European Board Test Workshop
• ASSET case study of high-speed bus testing presented at ITC
• Users awarded iPods for participating in survey
• System-level JTAG shown in proof-of-concept demonstration
  

CONNECT - February 2006

• Good, Better, Best In Test!
• Accuracy of BSDL has far-reaching consequences
• ASSET recognized as Best-in-Test for third consecutive year!
• Flexible configurations accelerate integration of ScanWorks with ICT systems
• Getting the lead out puts boundary scan in the mix
• IJTAG effort strives to simplify chip-level test
• ITC attendees briefed on ScanWorks for Intel® IBIST
• User Group gets the inside skinny on new products, services and support
• ASSET grades highly with users
  

CONNECT - November 2005

• DFT: Tackling the tough issues
• Validate testability before prototypes built
• ASSET and Agilent collaborate on web-based BSDL validation service
• International Test Technologies µMaster now supports ScanWorks’ Intel® IBIST
• Enhancements to ScanWorks Design Browser turns a few heads
• ITC meetings reveal an evolving 1149.1 boundary scan standard
• New ScanWorks 3.7 adds NAND programming, STAPL conversion, other features
• ASSET helping to define test technology for PICMG’s TCA standards
• New Examples Library offers shortcuts to functional code
• Test & Measurement World interviews ASSET CEO
• System-level boundary-scan test will highlight ASSET’s ITC and Productronica booths

CONNECT - July 2005

• System-Level JTAG tames those rising support, warranty, field service and other costs
• Planning for System-Level JTAG begins early
• Hundreds of processors now supported by Extended JTAG Coverage’s functional processor emulation testing
• New licensing options ensure ScanWorks is always-on
• ScanWorks delivers support where and when it’s needed
• New USB controller deals three aces: portability, convenience, cost-effectiveness
• New ScanWorks streamlines test application by combining AC and DC tests in one test action
• ScanWorks breaks into consumer electronics with Microsoft’s Xbox 360

CONNECT - April 2005

• Medalist ScanWorks marks a new phase for the ASSET-Agilent Relationship
• When are tests good enough? ScanWorks’ fault reports lead to better tests, better test coverage
• French telecomm firm shares a ScanWorks license between two facilities 800 km apart
• ASSET web site gets a face lift
• And the winner is….ScanWorks for second year in a row!
• Concurrent programming could increase efficiency by 30 percent
• Medalist ScanWorks is Agilent’s premiere JTAG tool on the new i5000 ICT and all 3070 systems
• Cisco engineer wins iPod! Webster at BAE Systems finishes second
• Webster has been committed to ScanWorks and boundary scan

CONNECT - December, 2004

• We do boundary scan right!
• System test with boundary scan
• ScanWorks will be first to support Intel’s next-generation design validation and test methodology – Intel® IBIST
• ScanWorks becomes the first JTAG system with processor emulation for extended test coverage
• ScanWorks tackles high-speed Gb/sec buses with new 1149.6 capabilities
• Win an iPod! Add to ASSET’s growing library of non-boundary scan device models
• New ScanWorks shows versatility of boundary scan
• EMS firm finds that ScanWorks pays for itself by saving "money, time and company resources"

CONNECT - August, 2004

• Test Re-Use: An Idea Whose Time Has Come
• Enhancements to ScanWorks include the latest test advancements
• Leading DVD chipset supplier turns to ScanWorks to ensure quality of devices
• ScanWorksAPI easily integrates JTAG tests into NI’s LabView, TestStand and others
• ASSET’s chief technologist will present on 1149.6 testing at third annual Board Test Workshop
• Agilent and ASSET collaborate on new 3070 test re-use products
• NOW PLAYING! New ScanWorks videos show how easy boundary scan can be

CONNECT - May, 2004

• Clearing the air on multiple scan paths
• ScanWorks Version 3.4 – What else is coming?
• Simplicity of ScanWorks speeds up HP’s time-to-test
• Sophisticated device modeling is key to optimizing automatic test generation
• Lead-free solder may shift test methods toward boundary scan
• New Partner Provider to support fast growing Asian market

CONNECT - January, 2004

• Value of ScanWorks® shines on every segment of marketplace
• Discovering ease-of-use with a new Assistant
• ScanWorks® tracks down faults missed by other test methods
• Boundary scan and CPU emulation team up to increase product quality
• ScanWorks® maintenance is founded on solid support, but offers much more
• Guidelines help smooth the implementation of new TopCAT features
• Scripting automates labor-intensive gaps in manufacturer's test processes

CONNECT - September, 2003

• New boundary-scan standard (IEEE Std 1149.6) will test high-speed interconnects
• Test strategies improve when boundary scan teams up with functional test
• ScanWorks/3070 saves Lucent $1 million
• Hardware options supporting ScanWorks are many and varied
• TopCAT automation and productivity enhancements highlight new ScanWorks 3.3.2
• New TopCAT automation technology for ScanWorks unveiled at ITC (Booth 1328)
• PXI controller enhances ScanWorks' compatibility with NI's test executives
• PXI State of the Union
• New Four-TAP Buffer Pod improves test coverage and throughput

CONNECT - May, 2003

• Get Connected
• How Process Automation Scripting cuts test development time from days to minutes
• ScanWorks reduces test costs and improves coverage for Vivace Networks' extremely complex boards
• ScanWorks 3.3 reduces memory test development times
• New multiple-port PCI-400 controller adds to the speed and flexibility of ScanWorks™
• Two new ScanWorks web libraries make test and programming development easier
• Linking manufacturing to design with boundary scan
• Boundary scan helps EMS companies cut test costs and increase revenues
• Test Tips - Automation in ScanWorks 3.3 increases user productivity
• ScanWorks for the Agilent 3070 completes successful assessment at Jabil Circuit
• Using boundary scan to link design and manufacturing test