ScanWorks® for Embedded Boundary Scan IP

The new ScanWorks® for Embedded Boundary Scan IP can be readily embedded in high-availability systems where it can apply system-level JTAG (SJTAG) test, diagnostic and programming algorithms. For manufacturers of high-availability systems in telecom, high-end computing and defense, this can be a real boon.

The boundary scan/JTAG infrastructure that was designed into the chips and circuit boards and implemented during design for prototype debug and during manufacturing for structural test purposes can now be re-applied later in the system’s life-cycle as a secondary maintenance bus when systems are installed in the field. With ScanWorks IP embedded in the system, boundary scan functionality can be initiated locally or remotely to meet installation, commissioning and field service requirements.

ScanWorks for Embedded Boundary Scan executes test actions for both the original IEEE 1149.1 Boundary Scan (JTAG) standard and the more recent IEEE 1149.6 standard for testing high-speed AC coupled differential interconnects.

“Historically, boundary scan has  been implemented on the manufacturing floor to structurally test printed circuit boards via external testers,” said Alan Sguigna, vice president of sales and marketing for ASSET. “Some system designers, needing extremely high reliability, have undertaken costly internal development efforts to embed boundary scan in their hardware. Now, designers can deploy our embeddable ScanWorks IP as an off-the-shelf solution at much less cost than developing and maintaining their own.”

With ScanWorks for Embedded Boundary Scan, system providers can offer unparalleled control of operations, administration and maintenance of their systems installed in the field. ASSET’s ScanWorks for Embedded Boundary Scan is the same IP found in ASSET’s Remote Instrumentation Controller (RIC) family, the first boundary-scan controllers to apply tests directly over the Internet. The RIC family was recently recognized by Test and Measurement World magazine as a finalist in the Best in Test 2008 awards program. For more information on this honor, click here.