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PCI-200EJ supports three
types of embedded instrumentation
The PCI-200EJ controller for ScanWorks and MicroMaster now supports three distinct types of embedded instrumentation technologies: boundary-scan (IEEE 1149.1/JTAG) structural test, CPU emulation-based functional test and diagnostics, and Intel®’s next-generation embedded instrumentation intellectual property (IP), Interconnect Built In Self Test (IBIST).
“As the speed of many chip interconnects exceeds five gigabits per second (Gbps) and some, like PCI Express 2, Serial ATA, Fibre Channel and others start to push six to eight Gbps, manufacturers are not able to validate signal integrity or to test systems with traditional probe-based intrusive test technologies,” said Alan Sguigna, ASSET’s vice president of sales and marketing. “By adding support for IBIST to the PCI-200EJ’s boundary-scan and CPU emulation-based capabilities, we have made it and ScanWorks an open platform for non-intrusive embedded instrumentation that manufacturers can deploy in design validation, test and debug applications.”
The initial version of the PCI-200EJ, which was announced in October of 2006, supported boundary-scan test (IEEE 1149.1/JTAG) and CPU emulation for non-Intel processors. In addition to supporting the embedded instrumentation tools of ScanWorks, all versions of the PCI-200EJ also support in-system or onboard programming of logic and flash memory devices that have already been soldered to circuit boards.
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