CONNECT NEWSLETTER

Issue Home

 

 

ASSET In The News:

Rick Nelson,
editor-in-chief of
Test and Measurement
World finds a lot to like
in ASSET's acquisition
of ITT. Click here to see
Rick's blog entry.

Test and Measurement
World's news article on
ASSET's acquisition of ITT.

EE Times on ScanWorks'
expanding embedded
instrumentation capabilities.

Testandmeasurement.com
details ASSET's expansion
of its embedded
instrumentation.


 

asset-intertech.com

ScanWorks®

DFT Analyzer™

Services

Customer Support

ASSET University

Success Stories

Global Contacts

Search Website:

CONNECT Archives

2007 - October

2007 - August

2007 - April

2006 - October

2006 - June

2006 - February

2005 - November

2005 - July

2005 - April

2004 - December

2004 - August

2004 - May

2004 - January

2003 - September

2003 - May

 

OBSERVATIONS

Glenn WoppmanASSET and ITT agree to merge


By Glenn Woppman
President and CEO of ASSET
and
Billy Fenton
Billy FentonCEO of the former International Test Technologies





Since we announced several weeks ago that our two companies would be merging, we’ve met with, talked to and exchanged emails with many of our respective users as well as the customers our two companies share. We’ve done this to communicate our excitement as well as the sense of challenge that this event represents.

Our two companies have been working closely together for three years as strategic partners. During this time, the mutual respect and admiration that we have for each other has only deepened. As a result, it seemed quite natural to contemplate and eventually consummate this merger.

We can assure you that ASSET InterTech will continue to provide industry-leading products, an extremely high level of support and the same extensive expertise that you have already experienced and which you have come to expect from us. Those aspects of our businesses have driven the success of our two companies individually and they will continue to ensure the success of our merged company.

We believe that this merger makes sense not just for us, but, more importantly, for you, our customers.We believe that this merger makes sense not just for us, but, more importantly, for you, our customers. Both ASSET and ITT have pioneered non-intrusive test solutions based on IEEE 1149.1 boundary scan (JTAG). ASSET’s ScanWorks environment is used in structural test while ITT’s MicroMaster employs the JTAG and/or a CPU’s debug port for functional test. Combining these two complementary solutions creates a test environment that can approach 100 percent test coverage on many hardware designs. In addition, a need is emerging in the marketplace for tools to validate the design of semiconductors and high-speed serial buses on circuit boards. The JTAG port is fast becoming the de facto access and control mechanism for the embedded intellectual property (IP) and instrumentation that is often required for these purposes. Together, ASSET and ITT are better positioned to meet these emerging needs for next-generation embedded instrumentation technologies

In fact, the processor-based emulation technology which MicroMaster utilizes can be considered a precursor to the next-generation embedded instrumentation technologies that are emerging today.In fact, the processor-based emulation technology which MicroMaster utilizes can be considered a precursor to the next-generation embedded instrumentation technologies that are emerging today. MicroMaster essentially provides functional debug solutions for printed circuit boards (PCBs). MicroMaster’s test and debug routines are controlled by the processor on a PCB. The PCB’s JTAG port delivers the test and diagnostic code to the CPU, where it is run at full CPU speed. Possible test routines include bus tests, memory tests and I/O tests. The result is a functional test suite with much greater fault diagnostic granularity and less cost than traditional functional tests or functional test systems. Applications of MicroMaster have included board prototyping, manufacturing test, fast flash memory programming, and debug and repair.

For a more detailed explanation of MicroMaster and its applications, click here to go to an in-depth article in this issue of Connect.

Advancing Non-Intrusive Test

Moving forward, we plan to take full advantage of MicroMaster’s processor emulation technology to perform more advanced functional validation and test routines. But, we won’t stop there. We have many plans for incorporating and integrating this technology under the ScanWorks umbrella and into other new products that will soon be on the drawing board.

At the very least, we envision emulation technology as an effective access mechanism for other embedded instruments. For example, emulation technology has already proven its worth in loading data into devices such as flash memory after they have been soldered to the circuit board. A large memory space can be loaded faster at CPU speeds with emulation technology than it could be loaded directly from the JTAG port on the board because the boundary scan path does not operate at CPU speeds. Actually, loading data via CPU emulation and/or the JTAG port complement each other quite nicely. Where fast, bulk data loading is required, it makes sense to put in the extra effort to set up CPU emulation to perform these routines, but where a smaller amount of data such as boot code is being loaded, direct access from the JTAG port is simpler and easier to perform.

Because MicroMaster performs functional tests, it could simulate routines normally executed by expensive external testers, such as packet blasters, logic analyzers, oscilloscopes or other devices.Other ideas for embedded emulation technology also come to mind. For example, because MicroMaster performs functional tests, it could simulate routines normally executed by expensive external testers, such as packet blasters, logic analyzers, oscilloscopes or other devices. And, since the applications code is executed by the CPU, these routines could enjoy the same powerful diagnostics capabilities currently provided by MicroMaster.

These and other potential applications offer a vast array of options for applying embedded instruments throughout the entirety of a system’s product life cycle. Adding processor emulation technology to ASSET’s product portfolio certainly enhances our flexibility for meeting a wider range of your test, design validation and debug needs. In fact, we’ve already observed a trend in the test marketplace to replace intrusive test methodologies like in-circuit test (ICT) with combinations of non-intrusive test techniques like boundary-scan and functional test. At the recent Productronica trade show in Germany, a ScanWorks user shared with attendees at a ScanWorks seminar how he had replaced ICT entirely with boundary scan and functional test. And, he said he has had no regrets whatsoever.

Transitional Issues

Of course, the first question everyone has when they hear of a merger is: How is it going to affect me? The answer comes in two parts. Over the short term, you will be affected very little or not at all. You will continue to be served by the people you are accustomed to. All existing ASSET and ITT customers will use the sales and support channels they’ve been using. The existing ITT management team, contracts administration, order processing, fulfillment and invoicing will remain the same. Then, as we combine our resources, we will do what we’ve always done. We will strive for excellence in fulfilling your test, debug and design validation needs. There will be no changes in this regard, but, over the longer term as we combine our resources and our various separate operating procedures, there may be slight alterations to how our merged company interfaces with some of you. Rest assured that our intent will always be to serve you better.

If you have any questions or concerns, please do not hesitate to call or email your normal contact person. We are eager for each one of you to join in our excitement.