New Examples Library
At the upcoming International Test Conference (Booth No. 1420) as well as Productronica (Booth No. A1.440) attendees will have a chance to see firsthand some of the exciting new system-level capabilities of ScanWorks.
Joining ASSET in its ITC booth will be several semiconductor manufacturers that have introduced JTAG multi-drop gateway devices or embedded boundary-scan controllers, which are often deployed in system-level JTAG applications. Representatives of Firecon International, Lattice Semiconductor, National Semiconductor and Texas Instruments will be present to explain the system-level capabilities of their boundary-scan devices and how these devices work with ScanWorks.
Other demos will include the new DFT Analyzer, which reduces manufacturing and test costs by validating the design-for-test (DFT) features in a circuit board design before any prototypes are assembled. (Click here for the Connect article on DFT Analyzer.) Moreover, the new collaboration between ASSET and Agilent Technologies, the free online BSDL Validation Service, will be shown at ITC. (Click here for more information on the BSDL Validation Service.)
Also scheduled for ITC, the ASSET User Group will meet at noon on Thursday, Nov. 10. Lunch will be provided. Some of the topics that will be discussed at the meeting include:
- System JTAG (SJTAG ) - Recent events and discussion
- Internal JTAG (IJTAG) - Recent events and discussion
- ASSET’s and Agilent’s collaboration on a new BSDL Validation Service
- ASSET’s new DFT Analyzer product - Demonstration and discussion
- HTMLhelp - What's coming and discussion
- Self-Service Licensing and Emergency License Tokens (SSL/ELT) - New Licensing options
To register for the User Group, click here.
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