In essence, Agilent has recognized ScanWorks as its premier JTAG bundled solution on its entire Medalist ICT product line, including the i5000 and 3070 systems. Tests generated by Medalist ScanWorks are fully compatible with both the i5000 and the 3070 systems.
“When we partnered with ASSET and integrated their ScanWorks tools into our 3070 product more than three years ago, we were making a commitment to bring the “best-in-class” boundary-scan solution to our customers,” said Marty Leeke, an Agilent ICT product manager. “Our commitment continues with the i5000. In Medalist ScanWorks, users of any Agilent ICT systems have a JTAG system that is truly powerful in terms of its test coverage and speed of test application for high-volume manufacturing operations. At the same time, it’s very easy to learn and use.”
The Medalist ScanWorks solution bundles ScanWorks with Agilent’s ICT-specific tools, Interconnect Plus and Silicon Nails. Users can migrate tests from a  ScanWorks station in their design departments to manufacturing, where ScanWorks tests can be merged with Silicon Nails tests, for example. Silicon Nails utilizes the hardware capabilities of the host ICT system to work with boundary-scan chains on a printed circuit board to automatically test non-boundary-scan devices. Combining ScanWorks and Silicon Nails tests creates a coordinated test suite that can then be applied on any Agilent Medalist ICT system. Such a test suite containing both ScanWorks and Silicon Nails tests achieves higher test coverage than either test type could on its own.
“By continuing the integration of ScanWorks with its ICT systems, Agilent is able to offer its ICT users the efficiency of re-using boundary-scan tests across the entire life cycle of a product,” said Alan Sguigna, ASSET’s vice president of sales and marketing. “JTAG design validation tests generated on a ScanWorks benchtop station during a product’s development phase can be re-used in high-volume manufacturing on ICT systems with Medalist ScanWorks. And later, these same boundary-scan tests can migrate to field service and repair operations, reducing the cost of test development and increasing overall productivity.” |
