Design validation capabilities earn plaudits for ScanWorks
 ScanWorks was named “Best In Test” for the second year in a row by Test & Measurement World, the electronic test industry’s leading trade publication.
Test & Measurement World made ScanWorks for High-Speed Buses one of the 12 finalists for the overall Best In Test 2005 award. T&MW named ScanWorks the best product in the test industry for “printed circuit board and system test.” Last year, ScanWorks earned an honorable mention Best In Test award. The magazine’s publisher, Russ Pratt, presented ASSET’s vice president of sales and marketing, Alan Sguigna, a Best In Test plaque at the Apex conference in Anaheim Feb. 23.
“This is certainly a great honor and a testament to the hard work of our product developers,” said Alan. “Over the years we’ve remained dedicated to doing just one thing, providing the most powerful yet easy boundary scan system in the industry. Because of this focus, the ScanWorks has become a solid foundation for a number of related test and programming technologies, enhancing the value of ScanWorks to its users.”
ScanWorks for High-Speed Buses is the first and only boundary scan test platform capable of performing design validation and interconnect tests on high-speed (1 to 10 gigabits per second) buses from the same platform as traditional static JTAG tests. Central to ScanWorks for High-Speed Buses is the integration of tools for Intel® IBIST (Interconnect Built-In Self Test), that company’s next-generation embedded test technology, as well as support for the IEEE 1149.6 Standard for Advanced Digital Networks, which takes advantage of a circuit board’s boundary scan infrastructure to test AC-coupled LVDS signals and high-speed buses such as Gigabit Ethernet, PCI Express, Fibre Channel and others.
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