| ASSET’s
chief technologist will present on 1149.6 testing at
third annual Board Test Workshop
 ASSET,
Agilent and TTTC, the Test Technology Technical Council
of IEEE, are sponsoring the third annual Board Test
Workshop Sept. 12 -14 in Fort Collins, CO. Adam Ley,
chief technology officer of ASSET, will present a paper
on the practical implementation of the IEEE 1149.6 standard
for testing AC-coupled nets within a board test strategy.
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Agilent
and ASSET collaborate on new 3070 test re-use products
 Boundary
scan test re-use, or migrating tests developed during
design to manufacturing and field service, holds many
benefits in terms of cost and time-to-market savings.
Now, new re-use solutions for Agilent 3070 ICT systems
make it easier and more affordable than ever before.
Test re-use solutions are available for any 3070 configuration
(UNIX, PC or dual-controllers), for any size manufacturer,
for any volume of boundary scan and for any budget.
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NOW
PLAYING! New ScanWorks videos show how easy boundary
scan can be
 Movie
trailers they’re not, but a new and growing library
of ScanWorks videos may be even better. The instructional
and informative video clips show just how easy it can
be to develop and deploy boundary scan test strategies.
And they can be accessed from several places, including
ScanWorks Assistant, the ScanWorks help menu and others.
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|
More
and more silicon vendors are realizing how critically
important is the quality of the boundary-scan description
language (BSDL) for their devices. MediaTek of Taiwan
has decided that ScanWorks, the leading boundary-scan
test system, is the right tool to ensure the quality
of their industry-leading chips for consumer products.