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OBSERVATIONS

New boundary-scan standard (IEEE Std 1149.6) will test high-speed interconnects
by Adam Ley

In many applications, high-speed serial interconnects between chips have begun replacing wide, parallel data paths. With the increasing use of techniques like AC-coupling and differential signaling, it won't be long before "dot- 6" capabilities become critical for many test engineers. Adam Ley, ASSET's Chief Technologist and a member of the IEEE's 1149.6 working group, takes a look at this newly approved boundary-scan standard.

TEST DATA OUT

Test strategies improve when boundary scan teams up
with functional test
by Dave Bonnett

Even though boundary scan and functional
testing address different portions of the fault spectrum, the possibilities are awfully exciting
when the two get together. Each has its own
strengths and weaknesses, but together they
add up to a very potent test strategy.

TAPPING IN

ScanWorks/3070 saves Lucent $1 million

Lower fixturing costs, slashed test development times and other economic benefits added up to about $1 million for Lucent Technologies when it examined the integration of ASSET's ScanWorks and Agilent's 3070 in-circuit test system.

TECH TIP

Hardware options supporting ScanWorks are many and varied

Without some hardware, ScanWorks would not be able to interface to the board or system being tested. Users have a myriad of hardware options from which to choose, ensuring that the right hardware is available for just about any implementation of boundary scan test and in-system programming.

INSIDE ASSET

TopCAT automation and productivity enhancements highlight new ScanWorks 3.3.2

Getting more done with less effort is one way to measure productivity. It's also what the new ScanWorks 3.3.2 does for test engineers and developers, thanks to new TopCAT automation technology. Check out the new ScanWorks with its diagnostic enhancements like automatic generation of test sequences and other new capabilities.

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PXI controller enhances ScanWorks' compatibility with NI's test executives

Already seamlessly compatible with National Instruments' TestStand, LabVIEW and LabWindows/CVI, the new PXI-100 controller enhances ScanWorks' role in functional test where PXI-based systems are used extensively.

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PXI State of the Union

Fred Bode, executive director of the PXI System Alliance, takes a look at the PXI standard and where the market is headed for PXI hardware and software. This article originally appeared in the June 2003 issue of Evaluation Engineering Magazine.

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