ScanWorks
3.3 reduces memory test development times
 The
latest version of ScanWorks streamlines the memory access
testing process by reducing test development and execution
times. Moreover, a new scripting capability for a more
efficient test flow as well as test and diagnostics
on DC-coupled differential signal pairs also have been
added to ScanWorks. A new web-based library of the device
models needed to create boundary-scan tests eases the
process of increasing test coverage, making sure you
achieve all the benefits of boundary-scan.
Read
More...
____________________________________________________
New
multiple-port PCI-400 controller adds to the speed and
flexibility of ScanWorks™
 The
new PCI-400 controller optimizes the ScanWorks environment
for high-volume, high-mix manufacturing environments.
With the PCI-400, tests and programming algorithms can
be applied at speeds up to 50 megabits per second (Mbps)
or at a test clock frequency of 50 MHz.
Read
More..._
___________________________________________________
Two
new ScanWorks web libraries make test and programming
development easier
 Two
new ScanWorks web libraries take customers to a wealth
of modeling information, updates, service packs, application
notes and much, much more. Soon, one of the sites will
serve as a portal into an interactive community that's
sharing thoughts, concepts and strategies on boundary-scan
test.
Read
More...
____________________________________________________
Linking
manufacturing to design with boundary scan
 The
benefits of boundary scan really shine when it is leveraged
across several organizational entities. Two experts,
one from Agilent Technologies and another from ASSET
InterTech, take a look at the leveraged benefits of
boundary scan when it is used to link design and manufacturing.
White
Paper...
|
