High-volume manufacturers like Jabil, Lucent, Tellabs and Raytheon/ODS have all realized significant cost savings as well as other business efficiencies as a result of migrating boundary-scan tests from the design phase of a product’s life cycle to manufacturing. In fact, a Lucent quantitative study found that one business unit within the firm saved approximately $1 million because it was able to re-use JTAG tests developed to validate and debug a design in its manufacturing environment on Agilent 3070 in-circuit test systems.
Other companies, like Tellabs, turned to combining boundary-scan test with ICT out of necessity. By failing to derive test coverage greater than 40 percent with some circuit boards on an ICT tester, Tellabs was led to a combined ICT/boundary-scan methodology. The resulting savings in terms of greater efficiencies, faster time-to-market and reduced costs for ICT test fixtures helped ScanWorks pay for itself in short order.
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Agilent
ScanWorks® Completes Successful Assessment at
Jabil Circuit. One of the first places electronics
manufacturers look to reduce expenses is through the
elimination of redundant effort. Jabil Circuit, Inc.
one of the top Electronic Manufacturing Services providers
was first to perform early assessment of Agilent Technologies'
and ASSET InterTech's joint effort to enable manufacturers
to leverage boundary scan tests across the product
life cycle. 
Ever on the lookout for ways to reduce costs and improve operating efficiencies, Lucent Technologies initiated a study to evaluate an implementation of ScanWorks® software on the Agilent 3070 Series 3 in-circuit test (ICT) platform. Lucent anticipated that the ScanWorks/3070 combination could lower overall test costs and reduce printed circuit board (PCB) test complexity by allowing Lucent test teams to reuse boundary-scan tests at in-circuit test. 
See how ASSET helped Raytheon and ODS reuse their tests as they moved from development to manufacturing. "With ASSET, we were able to develop one of our JTAG tests in two weeks. We were amazed how quickly boundary scan test development went," said Greg Knight of Raytheon. Ron Romero of Essential/ODS attests, "We were able to start testing the system via JTAG right away because we didn't have to generate tests from scratch. We just re-used Raytheon's boundary scan tests."
ScanWorks® reduces Tellabs JTAG and ICT costs while improving board quality. Vivace Networks, which was recently acquired by Tellabs, Inc., of Naperville, IL, makes very complex circuit boards with more than 9,000 nodes, ball grid array (BGA) and micro-BGA devices with more than 400 pins, 32 layers per board and numerous application-specific integrated circuits (ASICs) with as many as 1,247 pins. Besides the fact the new division of Tellabs could only get 40 percent test coverage on such a board, producing in-circuit test (ICT) fixtures to thoroughly test boards like this was proving to be a very expensive and time consuming proposition. 