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Test Re-Use

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Re-using JTAG tests, or moving tests from design validation and prototype debug into high-volume manufacturing and later field service and repair, can reduce costs tremendously. One key question regarding test re-use is how to efficiently apply boundary scan tests in a high-volume manufacturing environment? Several firms have found that integrating ScanWorks’ JTAG capabilities with in-circuit test (ICT) can provide the answer.

Formerly, Digidesign relied upon visual inspection and ICT testing in manufacturing. With ScanWorks on its ICT testers, its test coverage has increased dramatically. Lucent and Jabil have quantified the savings they've achieved from integrating ScanWorks with ICT. One Lucent business unit saved approximately $1 million while Jabil reduced its ICT test costs by 25 percent.

Qlogic wanted to extend its use of boundary scan into its contract manufacturer, who soon will be using ScanWorks on its ICT systems to perform JTAG tests and in-system programming. A major defense contractor found that it could combine ScanWorks and JTAG testing with ICT or flying probe systems in manufacturing and achieve greater efficiencies.