Re-using JTAG tests, or moving tests from design validation and prototype debug into high-volume manufacturing and later field service and repair, can reduce costs tremendously. One key question regarding test re-use is how to efficiently apply boundary scan tests in a high-volume manufacturing environment? Several firms have found that integrating ScanWorks’ JTAG capabilities with in-circuit test (ICT) can provide the answer.
Formerly, Digidesign
relied upon visual inspection and ICT testing in manufacturing.
With ScanWorks on its ICT testers, its test coverage
has increased dramatically. Lucent
and Jabil
have quantified the savings they've achieved from
integrating ScanWorks with ICT. One Lucent business
unit saved approximately $1 million while Jabil reduced
its ICT test costs by 25 percent.
Qlogic wanted to extend its use of boundary scan into its contract manufacturer, who soon will be using ScanWorks on its ICT systems to perform JTAG tests and in-system programming. A major defense contractor found that it could combine ScanWorks and JTAG testing with ICT or flying probe systems in manufacturing and achieve greater efficiencies.
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ScanWorks® Saves Digidesign Time, Stress and Pain. "When a board failed our diagnostic tests, a test technician would spend all day probing it with an oscilloscope until we found where the problem was," said Chris Durocher, manufacturing engineer for Digidesign™, the leading supplier of digital audio recording and editing systems, and winner of a 2001 Technical Grammy award for work performed on the movie, The Mummy Returns. "Now that we have ASSET ScanWorks™, we know exactly where the problem is in seconds. ScanWorks saves us a lot of time, stress and pain." 
Qlogic rates ScanWorks JTAG system "the best!" Miles Nelson, test engineer for Qlogic, Aliso Viejo, Calif., wanted to find the best JTAG test and in-system programming environment available. He methodically tried some of the boundary scan products he could find and came to an emphatic conclusion. 
Ever on the lookout for ways to reduce costs and improve operating efficiencies, Lucent Technologies initiated a study to evaluate an implementation of ScanWorks® software on the Agilent 3070 Series 3 in-circuit test (ICT) platform. Lucent anticipated that the ScanWorks/3070 combination could lower overall test costs and reduce printed circuit board (PCB) test complexity by allowing Lucent test teams to reuse boundary-scan tests at in-circuit test. 
Agilent
ScanWorks® Completes Successful Assessment at
Jabil Circuit. One of the first places electronics
manufacturers look to reduce expenses is through the
elimination of redundant effort. Jabil Circuit, Inc.
one of the top Electronic Manufacturing Services providers
was first to perform early assessment of Agilent Technologies’
and ASSET InterTech’s joint effort to enable
manufacturers to leverage boundary scan tests across
the product life cycle. 