ATE Integration Options

Test Re-Use Reduces Costs, Increases Test Coverage

Equipment manufacturers and contract manufacturers have found that integrating ScanWorks into in-circuit test (ICT) systems from a wide range of suppliers, including Agilent, Teradyne (GenRad) and others, is simple and elegant. In fact, some of the OEMs and EMSs that are already taking advantage of test re-use are Tellabs, Hewlett-Packard, Rockwell Automation and Rockwell Collins, Microsoft, Philips Electronics, Sanmina-SCI, Solectron, Wistron, Celestica, Flextronics and others.

Integration with ICT, flying probe testers (FPT) and manufacturing defect analyzers (MDA) enables boundary-scan tests that were developed to validate and debug designs to migrate to manufacturing where they can be re-used. This reduces test development time significantly and shortens the product’s time-to-market. Eliminating test points on ICT fixtures also cuts costs. And re-deploying these same tests later for functional and environmental testing can add to the cost-effectiveness of the product’s test strategy.

ScanWorks can be integrated with a broad range of tester types and specific test platforms. Click here for more information.

ICT Integration

ScanWorks has two ICT integration options:

Externally Integrated ScanWorks
Fully Integrated ScanWorks for the Agilent Medalist ICT Series

The versatile Externally Integrated ScanWorks solution can be applied to virtually any ICT system that is capable of calling an external application. Running on a PC cabled to the ICT system, ScanWorks periodically polls the ICT. If boundary scan tests are needed, the external ScanWorks system launches them automatically for application on the ICT.

For the technical details on integrating ScanWorks with ICT systems, click here.

For a white paper by ASSET and Agilent on linking design and manufacturing test with boundary scan, click here.

Best-in-Class ICT Integration with Agilent

The Fully Integrated ScanWorks for Agilent Medalist i5000 and 3070 systems is a best-in-class solution and the only completely integrated JTAG solution for any ICT system. ScanWorks runs on the Medalist platform’s internal PC controller and utilizes an integrated high-throughput ScanWorks PCI-400 JTAG interface with four test access ports (TAPs). This seamless integration generates a number of benefits, including automatic fixture building, integrated fault coverage and trouble ticket printing, and the elimination of ground bounce instability. The Fully Integrated ScanWorks for the Agilent Medalist Series is fully supported by both Agilent and ASSET worldwide.