IEC News Release - ASSET's DFT Analyzer named DesignVision finalist:
IEC Announces 2007 DesignVision Finalists Recognizing
Best Tools and Products in Semiconductor Industry
IEC begins the New Year recognizing 2006’s top innovations in electronic design; the first public announcement of DesignVision winners takes place at the end of the month in Santa Clara at DesignCon 2007
CHICAGO – Jan. 11, 2007 – Giving tribute to pioneering developments judged as the most beneficial to the design engineering community, the International Engineering Consortium (IEC) today announced the finalists of the prestigious 2007 DesignVision Awards.
IEC President John Janowiak stated, “Our DesignVision Awards honor those catalyzing positive change in high-technology, business, and academia, completely in line with the IEC’s mission. We are delighted to announce the winners at this year’s DesignCon in Santa Clara and share the best design advancements with the entire industry.”
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