ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.
Richardson, TX (July 14, 2010) - ASSET® InterTech, Inc., the leading supplier of open tools for embedded Instrumentation, will integrate test adapter intellectual property (IP) from IPextreme into its ScanWorks® platform for embedded instruments to enable chip and circuit board tests under the new IEEE 1149.7 reduced-pin boundary scan standard.
"IPextreme leads the market with the industry's first IEEE 1149.7 synthesizable IP," said Pierre Xavier-Thomas, vice president of engineering, IPextreme. "We are excited about working with ASSET to accelerate the availability of IEEE 1149.7 tools in the marketplace. This will enlarge the IEEE 1149.7 ecosystem and benefit end users."
ASSET® and IPextreme collaborate to enable ScanWorks® as an IEEE 1149.7 test solution - July 2010
Embedded Computing Design
EDACafé
SOCcentral
Embedded
Technology.com
Enhanced
Online News (EON)
infoTech
World
Market Media (WMM)
The
Austin 10
Ameritrade
ScanWorks® Validation and Testing Tool for Intel®'s future -
March 2010
Circuitnet
Electronic Production World
TechnicWeblook
Embedded
Computing Design
Evaluation
Engineering
Electronic Specifier
SOCcentral
Bloomberg Businessweek
Electro IQ
electronic-data
ScanWorks platform for embedded instruments named finalist for EDN's Innovation Award
FinanzNachrichten.de -
February 2010 (pdf)
ASSET’s
Al Crouch discusses innovative test strategies for 3D stacked die chips.
3Dincites.com - December 2009
ASSET's ScanWorks Support PLX Technology's PCI Express Switch Family's
visionPAK Diagnostic Toolset - November 2009
EDN -
(pdf)
EarthTimes - (pdf)
Circuitnet -
(pdf)
Fox
Business - (pdf )
IC Journal - (pdf)
PCBCafe -
(pdf)
Embedded
Computing Design - (pdf)
ElectroIQ - (pdf)
EPN_On-line - (pdf)
Strategic Relationship with Silicon Aid Extends ASSET's ScanWorks
Platform Into Chip Test and Verification - November 2009
Evaluation
Engineering - (pdf)
Circuitnet -
(pdf)
Earth Times - (pdf)
SOCcentral -
(pdf)
Embedded Computer Deign - (pdf)
EDA
Geek -
(pdf)
ASSET's new interposer opens test access to Intel Xeon processors 5500 series and Core i7 processors -
September 2009
BusinessWeek
ThomasNet
News -
(pdf)
SOCcentral - (pdf)
EDN - (pdf)
CompactPCI - (pdf)
EDA
Blog - (pdf)
DSP-FPGA.com -
(pdf)
Managing
Automation - (pdf)
AllBusiness
Cray
announces partnership for embedded diagnostics in supercomputers -
August 2009
insideHPC -
(pdf)
Linux.com -
(pdf)
Yahoo!
Finance
BNET -
(pdf)
Embedded
Computing Design - (pdf)
Evaluation
Engineering - (pdf)
Electronic
Specifier -
- (pdf)
ASSET InterTech's Dehne - Seeking Growth in Embedded Instrumentation -
July 2009
Test&Measurement
World - (pdf)
ASSET
ScanWorks Platform is First to Support for Intel Xeon Processor
5500
Circuitnet - May 2009 (pdf)
ASSET presented some of the latest advances in the JTAG world, including IEEE 1149.6, IEEE P1687 (IJTAG), and Processor-Controlled Test
Agilent European Webinar - April 2009
Embedded Instruments Target Product Life Cycle
EDN - March 2009
ASSET presented verification and test methodologies for ensuring silicon compliance to IEEE 1149.1
Agilent US Webinar- December 2008
EMC Presentation on Intel® IBIST in Practice at the Board Test Workshop, Fort Collins, CO
September 2008
ASSET InterTech and Testing House Mexico Partnership
May 2008
Facing the Challenge
New Electronics - November 2008
The Embedded Plan for JTAG Boundary Scan
Electronic Design - September 2008
Sum of the Parts
New Electronics - July 2008
External instruments down but not out
Taking the Measure - Blog on Test & Measurement World - May 2008
ASSET commits to developing open embedded instrument tools for the Internal JTAG (IJTAG) standard
EDA Cafe.com - April 2008
EE Times - April 2008
SMTA - April 2008
EDA Geek - April 2008
The wall between structural and functional test
Test & Measurement World - March 2008
ASSET, Verigy go holiday shopping
Taking the Measure - Blog on Test & Measurement World - December 2007
Design validation/test tool supports Intel IBIST
eeProductCenter - November 2007
ASSET expands next-generation embedded instrumentation -- ASSET ScanWorks® provides software solutions for Intel's at-speed design validation and test technology, Interconnect BIST (IBIST)
Semiconductor Packaging News - October 2007
EDA Cafe - October 2007
EDA Geek - October 2007
TMCnet - October 2007
Test and Measurement.com - November 2007
DFT Lab validates JTAG capabilities
Global-Electronics.net - February 2007 (pdf)
DFT Lab validates JTAG capabilities
Test & Measurement.com - February 2007 (pdf)
DFT Analyzer recognized as Design Vision Finalist
PCB Café - January 2007 (pdf)
DFT Analyzer recognized as Design Vision Finalist
PXI Technology - January 2007 (pdf)
Controller performs JTAG and emulation testing
Evaluation Engineering Magazine - February 2007
Structural Testing of high-speed buses using Intel IBIST - slides - paper
International Test Conference (ITC) - October 2006
New ASSET controller performs JTAG and emulation testing
ATE World - October 2006
ScanWorks features new level of openness
SCM Directory - October 2006
Best in Test for 2006 -- Honorable Mention
Test and Measurement World - December 2006
Tech Trends: Manufacturing Test
Test and Measurement World - April 2005
Best in Test for 2005
Test and Measurement World - December 2005
Best in Test for 2004 -- Honorable Mention
Test and Measurement World - December 2003
ASSET InterTech introduced the ScanWorks Assistant, Scan Path Discovery, and Multiple Scan Support modules in the latest version of its ScanWorks boundary-scan software....
Test and Measurement World - April 2004
Unitestech distributes test systems in Korea
Test and Measurement World - August 2004
"Boundary-Scan Workstation"
Test and Measurement World - August 2004
"JTAG test re-use products"
Test and Measurement World - September 2004
"ASSET and Agilent collaborate on JTAG offerings"
Test and Measurement World - September 2004
"Boundary Scan Tool Adds Processor Emulation"
Test and Measurement World - November 2004
"ASSET highlights support for 1149.6 for AC coupled nets..." at ITC 2004
Test and Measurement World - December 2004
"Lockheed Martin Team Integrates State-Of-The-Art Technology to Conduct"
Lockheed Martin - January 2002 (pdf)
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