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IEEE 1149.8.1

Boundary-Scan-Based Stimulus of Interconnections

to Passive and Active Components

 

Scope: This standard defines extensions to IEEE Std 1149.1 that standardize the boundary-scan structures and methods required to extend Boundary-Scan testing of connections to passive and/or active components. Such networks are not adequately addressed by existing standards, including those networks that are AC-coupled or differential. The selective AC stimulus generation enabled by this standard, when
combined with non-contact signal sensing, will allow testing of the connections between devices adhering to this standard and circuit elements such as series components, sockets, connectors, and ICs that do not implement IEEE Std 1149.1. This standard also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 required to describe and support the new test structures.

a.k.a. Powered Opens, Selective Toggle, A-Toggle or EXTEST Toggle

For boards with few test points, IEEE 1149.8.1 can improve opens test coverage.  Using P1149.8.1requires a test system that can control the TAP and use capacitive sensing, such as an ICT system.
 

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ScanWorks supports Intel®, ARM®, Freescale™,
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