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eBook: Testing High-Speed Memory with Embedded Instruments

How to Test High-Speed Memory with Non-intrusive Embedded Instruments - e-Book One of the most pressing problems for system manufacturers is testing memory and memory buses on circuit boards. The speeds are simply too high, and signals get easily distorted when touched by probes.

Today there are a number of new Non-intrusive Board Test (NBT) techniques available. Each method has its advantages and disadvantages over the others. Al Crouch, co-chairman of the the IEEE P1687 IJTAG committee, provides the ins and outs.

Download this ebook and you will learn about memory test methods and their tradeoffs. In particular some of the complexities in testing high-speed DDR (Double Data Rate) memory buses.
Summary of learning ...
  • What and where is the problem?
  • Memory test in general
  • DDR and high-speed memory structures
  • FPGA- and ASIC-based memory test
  • Soft access test methods and techniques
  • Intel®'s Interconnect Built-In Self Test (IBIST)



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