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ScanWorks High-Speed I/O (HSIO) Software

Development Software
Manufacturing Software
Hardware
Resources

HSIO Development Software

The High-Speed I/O Development software allows you to validate your high-speed designs, reduce the number re-spins due to high-speed bus issues, and go to production with confidence. The software helps you to:

  • Monitor inside the receiver, not outside the chip
  • Avoid inaccuracies caused by physically probing the signal
  • Perform bit error rate testing and margin tests
  • Validate all of your lanes at once, including the effect of crosstalk
  • Export quick tests that can be deployed to manufacturing

For high speed bus I/O validation, our customers are using HSIO development software to reduce the number of board changes due to signal integrity related issues.  The key value is to be able to complete signal integrity (SI) testing early in the process so the majority of the changes are made on the Alpha board. The Beta board can then focus on only minimal changes in the BIOS.

In essence, SI validation can be completed in two passes: The first pass on the Alpha board is where we catch the majority of the layout issues; the second pass is used to fine tune the buses and get maximum performance on the design.  Cost savings is achieved by reducing the number of spins on the board layout and reducing time to market.

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For more information, either contact your local sales representative or you can register to have an ASSET representative contact you.

Register

HSIO Manufacturing Software

Ensure that your quality remains high by repeating validation tests throughout the product life cycle.

  • Increase product quality through higher test coverage on high speed buses
  • Audit for performance problems that functional tests may not catch
  • Check for variances caused by supplier changes to PCBs or a new stepping of the silicon
  • Easily train new operators on the simple graphical user interface
  • Flag supplier process variances before they turn into customer complaints

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For high speed bus I/O testing, the HSIO manufacturing software reuses a subset of the validation tests.  For production, HSIO tests are used to achieve high speed I/O test coverage, confirm the performance quality of the bus, and collect margin data over time to see trends in high speed buses.  These tests determine if a design needs to be re-validated while the product is in production.  With ScanWorks® automation and test sequence capability, complex I/O bus integrity and performance testing can be accomplished in manufacturing with minimal skill and cost.

For more information, either contact your local sales representative or you can register to have an ASSET representative contact you. Register

Hardware

The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.

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Hardware types:
  • Ethernet hardware
  • USB hardware
  • PCIe hardware
  • PCI hardware
  • Other hardware

Go to hardware

High-Speed I/O Resources

Proudct Datasheets|Product Briefs
HSIO Flyer  ScanWorks® Tools for Validation and Debug based on Today's Intel® EV API and Next Generation IA

Xeon 5600  ScanWorks® Intel® IBIST Xeon 5600 DDR3 Testing

QPI  Intel®'s QuickPath Interconnect (QPI)

High-Speed Product Brief  ScanWorks for High-Speed Buses

Blogs
  High-Speed I/O Design Guidelines
  How to test DDR3, DDR4 and other memory buses is top-of-mind for many engineers. And rightfully so.
  Testing DDR3 and DDR4 memory - Part 2
  Testing PCI Express
  Testing Intel QuickPath Interconnect
  Is there a market for on-chip instrumentation?
  Testing SATA 3
  Structural Defects on High-Speed Serial I/O - Part 1
  Structural Defects on High-Speed Serial I/O - Part 2
  Adaptive Equalization and Power Consumption
  DDR4, Signal Integrity and Power Integrity
  Signal Integrity Margins of different DIMM Suppliers

  The Intel® Cougar Point SATA Bug

  Signal Integrity testing with CRCs versus pattern generation and capture


Case Study
Video
  Testing Intel® Xeon® 5500/Core™ i7 (Nehalem) platforms

Related Links


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eBooks|White Papers|Briefs
How to avoid poor serdes performance caused by circuit board manufacturing variances"How to avoid poor serdes performance caused by circuit board manufacturing variances - e-Book"


Intel® Haswell Testability Review using the ScanWorks® Platform for Embedded"Intel® Haswell Testability Review using the ScanWorks® Platform for Embedded Instruments - Application Brief"


Signal Integrity Validaton for Intel® Xeon® Platforms - An HSIO Application Brief"Signal Integrity Validation for Intel® Xeon® Platforms - An HSIO Application Brief"



e-Book: Bandwidth test reveal shrinking eye diagrams and signal integrity problems"e-Book: Bandwidth tests reveal shrinking eye diagrams and signal integrity problems"



Platform Validation using Intel® Interconnect Built In Self-Test (Intel® IBIST) - A DesignCon 2009 Paper"Platform Validation Using Intel® Interconnect Built-In Self Test (Intel® IBIST)" - Technical paper presented at DesignCon.


e-Book: How to Test High-Speed Memory with Non-intrusive Embedded Instruments"How to test high-speed memory with non-intrusive embedded instruments"


Explore our other ScanWorks Platform products

The ScanWorks platform validates performance, tests structural integrity and debugs hardware and firmware. And ScanWorks tests move along with the chips from design, into prototype board bring-up and on to volume manufacturing test. Cost-of-test is slashed by re-using tests over and over again.
 

CPU & FPGA Support

ScanWorks supports Intel®, ARM®, Freescale™,
& other CPUs; Altera®, Xilinx® and Lattice® FPGAs.

See the full range