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Press Releases

SourcePoint support for 64-bit ARM Embedded Trace Macrocell on AppliedMicro’s X-Gene speeds microserver time-to-market

October 01, 2014

By supporting the powerful 64-bit version of Embedded Trace Macrocell™ (ETMv4) from ARM® on AppliedMicro®’s X-Gene™ Server on a Chip™ processor, the SourcePoint™ debugger platform will shorten the time-to-market for enterprise systems in the cloud, such as the rapidly emerging microserver systems.

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ASSET and SoftIron collaborate on rapid debugging for 64-bit ARM-based enterprise servers using AppliedMicro's X-Gene technology

July 23, 2014

ASSET collaborated with SoftIron® Ltd., Southampton, UK, to quickly debug and bring up the industry’s first 64-bit ARM server motherboard based on AppliedMicro’s X-Gene® Server on a Chip™. SoftIron’s 64-0800 is an ultra-low power, high-performance server motherboard for the enterprise computing and data center market.

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ASSET's SourcePoint debug and trace tool accelerates software debug of Micro-C/OS-II code

April 15, 2014

Greater visibility into operating system resources and multithreaded programs accelerates debug and helps software engineers deliver tighter, more robust and higher quality code. With support for the Micriµm® µC/OS-II® real-time operating system (RTOS), ASSET’s SourcePoint™ debugger gives development engineers multiple views of the execution context at every point in the code.

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ASSET announces debugging tools to accelerate development of cloud applications based on AppliedMicro's X-Gene Server on a Chip solution

February 25, 2014

ASSET® InterTech announces the enablement of ASSET’s software debug tools for AppliedMicro®’s X-Gene™ Server on a Chip™ silicon solution, which is being rapidly deployed in the cloud.

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ASSET’s SourcePoint debug and trace tool now supports ThreadX operating system

February 20, 2014

When software engineers have greater visibility into the context of operating system resources and the execution of multithreaded programs, they are able to accelerate code debug and deliver new products to market sooner. ASSET's SourcePoint™ debugger now supports Express Logic’s ThreadX real-time operating system, giving development engineers multiple views of the code execution context at any point in a program.

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Faster debug and trace using ARM System Trace Macrocell (STM) explained in new eBook

January 21, 2014

Accelerating software development by finding code bugs faster is quite challenging for systems-on-a-chip (SoCs) because of multithreaded software, multiple processing cores of different types and other factors. A new eBook published by ASSET® InterTech explains System Trace Macrocell (STM), a relatively new code tracing capability that gives much more visibility into changing system states so that the causes of bugs becomes more apparent.

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ASSET's Arium software debugger turbo charges ARM’s System Trace Macrocell

October 29, 2013

Accelerating the tracking of software bugs through mountains of trace data back to their root causes shortens the development of multicore, multithreaded systems-on-a-chip (SoC) by months and delivers new products to market sooner. Enhancements to ASSET InterTech’s Arium hardware-assisted SourcePoint™ debugger optimize the processing of ARM’s System Trace Macrocell (STM), which provides developers a system-level perspective of trace data.

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ASSET's Arium tools will debug ARM code in TI's multicore OMAP architecture

October 22, 2013

Designers of systems based on one or more Texas Instruments (TI) OMAP application processors with ARM cores can now debug software and firmware code faster with ASSET® InterTech’s Arium SourcePoint™ debugger for ARM.

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ASSET's Arium software debugger supports Intel's new Silvermont microarchitecture with Real-Time Instruction Trace (RTIT)

October 15, 2013

Software engineers debugging code for multicore systems-on-a-chip (SoC) based on Intel®’s new Silvermont microarchitecture will be able to take advantage of Silvermont’s Real-Time Instruction Trace (RTIT) capability with ASSET® InterTech’s Arium SourcePoint™ debugger.

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ASSET's Arium tools support Intel C2000 Atom, accelerating software debug for new class of microservers

October 08, 2013

Designers of microservers based on the new Intel® C2000 Atom™ system-on-a-chip (SoC) will be able to debug software and firmware faster because of the powerful tools in ASSET® InterTech’s Arium SourcePoint™ debugger.

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ASSET's Arium tools will debug ARM code in TI's multicore KeyStone architecture

October 01, 2013

Designers of applications like networking systems, imaging, high-performance computing, gaming, media processing and others that are based on processors with the multicore Texas Instruments (TI) KeyStone II architecture now have a powerful set of software and firmware debugging tools in ASSET® InterTech’s Arium SourcePoint debugger for ARM.

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ScanWorks demonstrates compatibility with new IJTAG standard for embedded instruments

September 10, 2013

At the International Test Conference (ITC) this week, ScanWorks is demonstrating how it supports the IJTAG standard’s Instrument Connectivity Language (ICL) and Procedural Description Language (PDL), two of the key components of the IJTAG embedded instrumentation standard.

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ASSET announces new bundle of validation and test tools for Intel Xeon, Core and Atom designs

September 10, 2013

ASSET announced at the Intel Developers Forum a new bundle of ScanWorks HSIO tools for the Intel Architecture (IA). Previously licensed separately, ScanWorks HSIO for IA now delivers greater value to developers by bundling tools for all three Intel silicon brands, Xeon, Core and Atom, under one license.

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Programming on-board flash and EEPROM memory at SPI bus speeds from an FPGA is explained in new eBook

September 04, 2013

Designers and manufacturing engineers face challenges when it comes to quickly programming flash and EEPROM memories that are already soldered to a circuit board.A new eBook explains the pros and cons of several different methods for programming memory devices connected to the Serial Peripheral Interface (SPI) bus.

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Faster firmware debug with Intel embedded trace capabilities discussed in new eBook

August 14, 2013

The complexity and sheer scope of today’s systems with their multiple processors, multiple cores and multi-threaded software can be challenging to developers who are debugging software and firmware. A new eBook by ASSET, the leading supplier of tools for embedded instrumentation, discusses how hardware-assisted debugging tools are able to tap into the embedded trace resources in Intel® processors to methodically and quickly track bugs through the interrelated web of software, firmware and hardware.

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Testing DDR3 memory with boundary scan / JTAG explored in new eBook by ASSET InterTech

August 06, 2013

ASSET® InterTech has issued a new eBook on how to test DDR3 memory with non-intrusive JTAG or boundary-scan (IEEE 1149.1) methods. A recent survey of engineers by the International Electronics Manufacturing Initiative (iNEMI) found that testing memory soldered to circuit boards is a major problem for system manufacturers.

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ASSET InterTech and Arium join forces to increase visibility into complex system development

July 09, 2013

ASSET InterTech today acquired the business of Arium, provider of software debug tools for systems based on Intel and ARM processors.

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ASSET’s new eBook explains how to recover the costs sunk into circuit boards that will not boot

June 06, 2013

A new eBook from ASSET InterTech , will help circuit board manufacturers who want to recover their investment in assembled boards that won’t boot – so called dead boards – and still maintain the tight production deadlines that constantly reduce the time they can spend on board debug.

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ASSET ScanWorks is among the first tools to support the new on-chip Intel Silicon View Technology

June 03, 2013

With the introduction today of Intel® Silicon View Technology (Intel® SVT), ASSET® InterTech’s ScanWorks® platform for embedded instruments becomes the only platform in the industry that fully supports all three aspects of the new validation, debug and test capabilities which Intel is embedding into its processors and chipsets.

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How to do functional tests on I2C and SPI monitors with JTAG is explored in new eBook from ASSET InterTech

May 08, 2013

A new eBook from ASSET explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during circuit board production.

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New PXI controller for ASSET’s ScanWorks platform supports four test technologies

April 23, 2013

With the new PXI-based controller for ASSET® InterTech’s ScanWorks® platform for debug, validation and test, engineers can test circuit boards with four different toolsets, each based on a different test technology.

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ASSET enhances IJTAG embedded instrumentation tool for debugging systems-on-a-chip (SoC) and testing circuit boards

March 27, 2013

Improvements to the graphical viewer and significantly faster performance are among the enhancements to ASSET® InterTech’s ScanWorks® IJTAG Test tool, with which engineers are able to access, control and automate the operations of test and measurement instruments embedded in chips.

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New e-Book explores CPU cache-as-RAM for board bring-up of non-booting prototype circuit boards

February 26, 2013

A new e-book from ASSET® InterTech takes a close look at how run-control tools can employ a processor’s on-chip cache memory instead of on-board RAM memory to boot non-booting prototype circuit boards.

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New e-book explores how manufacturing process variances affect throughput on high-speed serdes

February 12, 2013

High-speed serdes (serializer/deserializer) links on printed circuit boards (PCB) sometimes don’t achieve their expected throughput rates because of process variances in manufacturing. A new e-book from ASSET® explains the defects caused by process variances and how they can be detected with minimum effects on the manufacturing line.

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ASSET white paper explores solutions for diminishing test coverage from in-circuit test (ICT) systems

December 19, 2012

A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-based non-intrusive methodologies that test from the inside out and eliminate the need to physically probe chips and circuit boards during prototype board bring-up, volume manufacturing and troubleshooting in the field.

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ASSET ScanWorks’ two FPGA-based instruments for testing on-board memory named Best in Test finalists

December 13, 2012

Two new instruments for ASSET® InterTech’s ScanWorks® platform for embedded instruments have been named finalists by Test & Measurement World in its 2013 Best in Test awards program. ASSET’s instrumentation intellectual property (IP) supports the new IEEE P1687 Internal JTAG (IJTAG) standard for embedded instruments.

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New white paper reveals shrinking eye diagrams and signal integrity problems on high-speed buses

November 27, 2012

A new white paper from ASSET® InterTech points out how increasing bus speeds on circuit boards could create havoc for signal integrity on those buses, in turn degrading the bus’ throughput performance. Each new generation of a high-speed bus typically runs at a higher signal frequency, but this decreases the margin for error on the bus, making it more sensitive to disruptions from jitter, inter-symbol interference (ISI), crosstalk and other factors.

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Integrating ASSET's ScanWorks with Linear Technology's LTpowerPlay delivers new in-system programming and JTAG test tools to power devices on the PMBus

October 23, 2012

ASSET® InterTech and Linear Technology Corp. have collaborated to combine the programming and configuration capabilities of Linear Technology’s LTpowerPlay™ software with the JTAG/ boundary-scan test capabilities of ASSET’s ScanWorks® platform for embedded instruments.

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ASSET integrates ScanWorks with Teradyne's PXI Express instruments for robust JTAG and boundary-scan test and device programming on large-scale testers

September 10, 2012

ASSET® InterTech and Teradyne have extended the integration of the JTAG and boundary-scan test capabilities of ASSET’s ScanWorks® platform for embedded instruments into Teradyne’s PXI Express-based High Speed Subsystem (HSSub).

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New tutorial explains how IJTAG standard streamlines chip validation and characterization

August 23, 2012

A new introductory tutorial from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, explains how the new IEEE P1687 Internal JTAG (IJTAG) standard simplifies and automates the way chip designers manage embedded instruments which perform chip validation and characterization.

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ASSET ScanWorks high-speed I/O validation tools are first for Intel Atom micro server designs

August 15, 2012

Designers of micro server circuit boards based on the Intel® Atom™ processor now have for the first time a tool capable of non-intrusively validating the signal integrity on high-speed input/output (HSIO) and memory buses. The ScanWorks® platform for embedded instruments from ASSET® InterTech is the first design validation tool for Intel Atom designs that does not rely on placing a physical probe on a bus to monitor its signal integrity.

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ASSET's two new embedded instruments test memory from a board-tester-in-a-chip

August 07, 2012

ASSET® InterTech has added two new memory test instruments to its ScanWorks® embedded instrumentation library for its FPGA-controlled test (FCT) circuit board test tool, giving electronics manufacturers a cost-effective non-intrusive means of increasing test coverage.

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ASSET's two new ScanWorks controller kits tap into high-speed PCI Express bus

May 17, 2012

Two new controller kits for the ScanWorks® platform for embedded instruments from ASSET® InterTech can accelerate test throughput by plugging into the high-speed PCI Express® (PCIe) bus in the personal computer where ScanWorks is running. ASSET is the leading supplier of tools for embedded instrumentation.

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ASSET's board bring-up solution first to validate, test and debug designs using the Intel microarchitecture codenamed Haswell

April 12, 2012

With new tools for the ASSET® ScanWorks® platform for embedded instruments, design engineers can for the first time structurally verify, functionally test, analyze performance margins and debug boards based on the Intel® microarchitecture codenamed Haswell within one unified software environment.

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ASSET ScanWorks FCT named to EDN magazine's Hot 100 Products list

November 29, 2011

ASSET® InterTech's ScanWorks® FPGA-controlled test (FCT) has been named to the Hot 100 Products list by the editors of EDN magazine, an authoritative publication and web site serving the electronics industry.

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Four products within the ASSET ScanWorks platform for embedded instruments are named Best in Test finalists

November 15, 2011

Four new products for ASSET® InterTech's ScanWorks® platform for embedded instruments have been named finalists by Test & Measurement World magazine for its 2012 Best in Test awards.

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ASSET's new Ethernet controller for ScanWorks tests four circuit boards at once

November 01, 2011

The new Remote Instrumentation Controller 4000 (RIC-4000) for ASSET®'s ScanWorks® platform for embedded instruments can connect over an Ethernet network and apply boundary scan (JTAG) tests on as many as four circuit boards at once. The units under test (UUT) and ScanWorks could be in the same room on the same local network or they might be across the globe, connected over the Internet.

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ASSET's new FPGA-controlled test (FCT) inserts and operates a board-tester-in-a-chip

September 20, 2011

With new tools for the ASSET® ScanWorks® platform for embedded instruments engineers can simply select instruments they need, set their parameters and insert them into a field programmable gate array (FPGA) to function as a circuit board tester. Once inserted, ScanWorks FCT operates the board-tester-in-a-chip from a drag-and-drop user interface to perform validation, test and debug.

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ASSET ScanWorks is first to offer validation tools for new Intel® microarchitecture codenamed Haswell

September 13, 2011

When circuit board designs for desktop and mobile applications roll out with Intel® Core™ processors based on the new Intel microarchitecture codenamed Haswell, ASSET®'s ScanWorks® platform for embedded instrumentation will be the only tool able to access Intel's embedded instruments and perform advanced validation on all of a board's high-speed buses.

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ASSET integrates ScanWorks with Teradyne Di-Series instruments for robust boundary-scan test

September 13, 2011

ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Teradyne (www.teradyne.com), the leading supplier of automatic test equipment (ATE), have collaborated to integrate the boundary-scan test capabilities of ASSET's ScanWorks® platform for embedded instruments into Teradyne's Di-Series of high-performance digital test instrument hardware.

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ASSET's new modeling methodology extends non-intrusive JTAG/boundary-scan test coverage

September 08, 2011

A new model-based test methodology for ASSET® InterTech's ScanWorks® platform for embedded instruments extends non-intrusive boundary-scan (JTAG) test coverage to devices that previously could not be tested or programmed with boundary scan.

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ASSET joins PCI-SIG so add-in cards can validate their access to Intel's embedded instrumentation

June 09, 2011

ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, has joined the PCI-SIG® and plans to participate in the group's upcoming interoperability workshops. As a result, manufacturers of PCI Express (PCIe) add-in cards (AIC) will be able to validate that their cards interoperate with ASSET's ScanWorks® platform for embedded instruments.

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First embedded debugger for Intel x86 platforms can diagnose systems remotely

March 30, 2011

A new embedded debugger from ASSET® InterTech is the first debugger that can be embedded into Intel® x86 platforms for remote or local diagnostics.

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ASSET launches validation tools for mobile and desktop systems designed for future 22nm based Intel Core processors

March 01, 2011

ScanWorks is the first third-party validation platform for designs targeting future 22nm based Intel® Core™ processors.

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ASSET ScanWorks is first test tool for Intel's new 2nd generation Core i3, i5 and i7 processors

February 15, 2011

ScanWorks performs structural and functional tests on circuit boards with mobile or desktop Intel® Core™ (Sandy Bridge) processors.

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ASSET ScanWorks named Best in Test finalist for high-speed memory bus validation toolkit

December 07, 2010

The ScanWorks® platform for embedded instruments from ASSET® InterTech has been honored by Test and Measurement World magazine by being named a finalist in the 2011 Best in Test awards. ASSET (www.asset-intertech.com) is the leading supplier of open tools for embedded instrumentation.

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Frost & Sullivan recognizes ASSET for its competitive strategy innovation for ScanWorks platform

November 30, 2010

The ScanWorks® platform for embedded instruments from ASSET® InterTech has received a 2010 Global Competitive Strategy Innovation of the Year Award from Frost & Sullivan, a global research and consulting firm.

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ASSET's ScanWorks is first development tool for the emerging IJTAG embedded instrumentation standard

November 02, 2010

ScanWorks® IJTAG enables portable validations, test and debug routines for chips, circuit boards and systems

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ASSET partners with Flextronics to accelerate adoption of new IEEE P1687 embedded instrumentation standard

November 02, 2010

ASSET® InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has partnered with Flextronics, a leading electronics manufacturing services (EMS) provider, to accelerate the adoption of the new IEEE P1687 Internal JTAG (IJTAG) standard.

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New ASSET ScanWorks toolkit allows memory suppliers to validate DDR3 memory for Intel platforms

September 14, 2010

Tools for Intel® embedded instrumentation technology made available to memory suppliers through ASSET®/Intel® collaboration

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ASSET enhances boundary-scan test capabilities on ScanWorks Platform for Embedded Instruments

August 31, 2010

Tests generated faster with advanced development and debug tools

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ASSET and IPextreme collaborate to enable ScanWorks as an IEEE 1149.7 test solution

July 14, 2010

Once integrated with IPextreme's IP, ASSET's ScanWorks will perform IEEE 1149.7 chip and board tests

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ASSET is first to support new Intel Xeon processors 5600/7500 series and Itanium 9300 processors with validation and test tools

May 18, 2010

ScanWorks® platform for embedded instruments features industry's only third-party tools for Intel®'s Interconnect Built-In Self Test (IBIST)

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ScanWorks enhanced with comprehensive validation tools for high-speed I/O on future Intel® Platforms

March 11, 2010

ASSET's ScanWorks platform for embedded instrumentation remains the only toolset for Intel®'s Interconnect Built-In Self Test (IBIST)

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ScanWorks platform for embedded instruments named finalist for EDN's Innovation Award.

February 24, 2010

Second honor in two years demonstrates ASSET's leadership in test and measurement innovation

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ASSET notches two more Best in Test finalist awards from Test & Measurement World magazine

January 06, 2010

ScanWorks® embedded and ScanWorks® validation and test support for Intel® Xeon® Processor 5500 Series are recognized as technical breakthroughs

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Strategic relationship with SiliconAid extends ASSET's ScanWorks® platform into chip test and verification

November 03, 2009

Chip debugger will be integrated into ScanWorks®; ASSET to resell IEEE P1687 insertion and verification tools

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ASSET's ScanWorks supports PLX Technology's PCI Express switch family's visionPAK diagnostic toolset

November 03, 2009

ASSET InterTech and PLX Technology, Inc. today announced that ASSET's ScanWorks® platform for embedded instrumentation is supporting the exclusive PLX® visionPAK" packet generator/system analyzer toolset.

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ASSET's new interposer opens test access to Intel Xeon processors 5500 series and Core i7 processors

September 22, 2009

CPU's debug port can be accessed for validation, test and debug on Intel-based circuit boards

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Cray selects ASSET's ScanWorks platform for embedded diagnostics in next-generation supercomputers

August 19, 2009

Contract calls for two companies to collaborate on embedded test logic

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Dehne, longtime National Instruments executive, joins ASSET's Board of Directors

June 17, 2009

Tim Dehne has joined the board of directors of ASSET® InterTech, Inc. Over a career stretching more than 21 years at NI, Mr. Dehne led global marketing, and research and development at the company that had $824 million in revenues in 2008.

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ASSET ScanWorks platform is first to support both validation and test for new Intel Xeon processor 5500 series

May 06, 2009

Nehalem microarchitecture with QuickPath Interconnect can be validated and tested with ScanWorks® Intel® IBIST® and processor-controlled test

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ASSET InterTech's Woppman named one of only four finalists for "Innovator of the Year"

February 02, 2009

ASSET InterTech's Woppman named one of only four finalists for "Innovator of the Year"

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ASSET Remote Instrumentation Controller named Best In Test Finalist for 2009

January 27, 2009

First JTAG controller capable of applying tests over the Internet earns ASSET fourth 'finalist' honor in six years

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ASSET's ScanWorks for Embedded Boundary Scan offers in-system JTAG test and diagnostics

January 20, 2009

Embedding ScanWorks in high-availability systems optimizes remote test application and programming

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ASSET Joins Mentor OpenDoor Program to ensure JTAG interoperability

May 13, 2008

ASSET InterTech has joined the Mentor Graphics OpenDoor Program in order to ensure toolset interoperability for embedded instrumentation applications.

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ASSET aligns company, technology and products with embedded instrumentation

May 12, 2008

Responding to the increasing momentum in the electronics industry toward embedded instrumentation, ASSET® InterTech, Inc. announced it is positioning the company, its products and its technologies to provide open tools for embedded instrumentation in design validation, test and debug applications.

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