For Working Media

ASSET Company Backgrounder

Driving embedded instrumentation for chip, board and system validation, debug and test

Embedded Instrumentation Position Paper

Embedded Instrumentation Ushers in a New Era for the Test and Measurement Industry

FPGA-Controlled Test Backgrounder

FPGA-Controlled Test (FCT) Backgrounder"Board-tester-in-a-chip"

ScanWorks® logo with tag line

Preferred ScanWorks logo when size allows the tag line to be read. Width 1000.

ScanWorks® logo without tag line

ASSET® logo with tag line

Preferred ASSET logo when size allows the tagline to be read.

ASSET® logo without tag line

How to Debug Dead Boards Image

Block Diagram Showing Functional Test with JTAG

ITC 2011 Press Kit

International Test Conference Press Kit, September 20, 2011 Press Release - ASSET's new ...

ITC 2010 Press Kit

International Test Conference Press Kit, November 2, 2010 Press Release - ASSET's ScanWo...

ITC 2009 Press Kit

International Test Conference Press Kit, November 3, 2009 Press Release - Strategic relation...

Embedded Instrumentation 2008 Press Kit

Embedded Instrumentation Press Kit, May 14, 2008 Press Release - ASSET aligns company, techn...

Non-Intrusive Board Test (NBT)

Multiple soft-access test technologies, combined to maximize test coverage.

ScanWorks® Embedded Diagnostics

Remote diagnosis and debug of high-availability systems via ScanWorks® embedded IP.

ScanWorks® PCT Overview Movie - HD

This movie explains the features and benefits of Processor-Controlled Test, including the typ...

ScanWorks® PCT Demo Movie - HD

This movie demonstrates the Processor-Controlled Test software interface, showing how it can ...

Testing Intel® Xeon® 5500 / Core i7 (Nehalem)

This video covers an overview of four different fault types and how our ScanWorks Platform to...