ASSET InterTech, Inc. invites you to visit us at any one of the below exhibits to learn about ScanWorks® for Embedded Instrumentation for boundary-scan test (BST), processor-controlled test (PCT), high-speed I/O (HSIO) validation / Intel® Interconnect BIST (IBIST), Software Debug and Trace, IJTAG test, and FPGA-controlled test (FCT).

Tradeshows and Workshops

ASSET technologists and product managers present at many trade shows.  Here are some of the recent and upcoming presentations, panels and events:
Intel® Developers Forum (IDF)
International Test Conference (ITC)  
IEEE International Workshop on Defect and Adaptive Test Analysis (DATA)
Organizers: Jeff Roehr Program Chair (TI), Al Crouch Test Standards Chair (ASSET), Jennifer Dworak Vice-Program Chair (SMU)
  • DATA 2012 - Anaheim, CA, Nov. 9, 2012

Nordic Test Forum (NTF)
  • "Differences between IEEE 1149.1-2013 and IEEE P1687" -Speaker: Jennifer Dworak(SMU), Al Crouch (Asset).

The Design, Automation and Test in Europe (DATA)

Latin American Test Workshop (LATW)
IEEE North Atlantic Test Workshop (NATW)
Asian Test Symposium (ATS)
  • ATS 2012 - Niigata, Japan, November 19-22, 2012

ARM® TechCon™
EE Journal's Amelia Dalton weekly Fish Fry interview with Glenn Woppman at ARM TechCon.

Freescale Technology Forum (FTF)
Electronics Engineering Live! — Featuring The Embedded Systems Conference (EE Live!)
Embedded World Conference
Silicon Valley Test (SVT)
IEEE VLSI Test Symposium (VTS)
Southwest Design for Test (SWDFT)
  • SWDFT 2014 - Austin, TX, May 8-9, 2014
  • SWDFT 2013 - Austin, TX, June 6-7, 2013
    • "Embedded Instrument Security" - Jennifer Dworak, Presenter, By Al Crouch (ASSET),  John Potter (ASSET), and Jennifer Dworak (SMU) Presentation Paper
  • SWDFT 2012 - Austin, TX, May 2-3, 2012
    • Al Crouch, ASSET - Steering/Organizing Committee

Board Test Workshop
Design Automation Conference (DAC)
  • 50th Anniversary Design Automation Conference, Austin, Texas, June 2-7, 2013
    • Test/Diagnose/Debug: Let the 3D-IC Chaos Begin
      June 5, 1:30pm to 2:30pm, Panelist: Al Crouch (ASSET),Krishendu Chakrabarty (Duke); Mike Shapiro (IBM); Shahin Toutounchi (Xilinx) Panel Position Presentation
    • "DFT and Test", Al presented the "History of DFT and Test according to Al", - Author / Presenter: Al Crouch (ASSET)
    • "Adventures in Time and Space: Targeting Resiliency", Embark on a trip to the land of reliability and explore how current and future techniques will save us all from decaying and unpredictable chips. - Chair: Al Crouch (ASSET)

CPU & FPGA Support

ScanWorks supports Intel®, ARM®, Freescale™,
& other CPUs; Altera® and Xilinx® FPGAs.

See the full range