ScanWorks®
Integrated into all of Agilent's Medalist ICT Systems
Continuing its longstanding strategic relationship with Agilent
Technologies, ASSET's ScanWorks JTAG test and programming system
has been integrated into the complete line of Medalist ICT systems,
including the new i5000 series as well as the established 3070
systems.
 ScanWorks
forms the basis for Medalist ScanWorks,
Agilent's premiere boundary-scan solution on all Medalist ICT
platforms. With ScanWorks on a Medalist ICT system, manufacturers
can reduce test costs significantly by taking advantage of the
portability of JTAG tests. Tests developed on a standalone ScanWorks
development station in the design department can be re-used in
manufacturing on a Medalist ICT system, reducing the time, cost
and effort typically required to develop a manufacturing test
suite. Deploying boundary-scan tests also cuts the cost of ICT
operations by reducing the complexity of fixtures as well as the
time to produce them. In addition, these same boundary-scan tests
and programming operations can be re-used later by the support
or service department to troubleshoot, maintain or upgrade systems
in the field.
ScanWorks tests and programming operations are completely compatible
with all configurations of the i5000 and the 3070
Medalist ICT systems. Medalist ScanWorks also paves the way
for the more advanced capabilities of ScanWorks, such as the testing
of high-speed serial buses with IEEE 1149.6, the embedded test
capabilities of Intel® IBIST and the concurrent in-system
programming functionality of IEEE 1532.
Medalist ScanWorks is a comprehensive boundary scan bundle supported
worldwide by Agilent. It combines the ScanWorks boundary scan
system with Agilent's Interconnect Plus and Silicon Nails tools.
Medalist ScanWorks simplifies the development of coordinated test
suites which take advantage of the unique capabilities of ScanWorks,
Interconnect Plus and Silicon Nails. For example, ScanWorks and
Silicon Nails tests can be merged and applied on an Agilent Medalist
ICT system as a coordinated test suite, achieving higher test
coverage than either test type could on its own.
The figure below illustrates the integration of ScanWorks on
an Agilent i5000 ICT system.
ScanWorks®
for any 3070
Because 3070 ICT systems can be configured with
a PC controller, UNIX controller or both, ScanWorks for the
3070 comes in three configurations to meet the needs of every
3070 user.
For example, manufacturers with a low volume of
boundary-scan test re-use and a 3070 with a UNIX controller
can utilize the Externally Integrated ScanWorks for the 3070.
In addition, for 3070s operating in a dual-controller mode with
both UNIX and PC-based controllers, the Internally Integrated
ScanWorks for the 3070 is compatible with both controllers.
And lastly, the Fully Integrated ScanWorks for the 3070 combines
ScanWorks and its high-volume, four-port PCI-400 controller
with 3070s running a PC controller.
For
a Fact Sheet on Medalist ScanWorks solutions, click here.
Agilent and ASSET InterTech continue to work
in partnership to deliver the best solutions for a variety of
challenging and emerging technology issues that Medalist 3070
users face. For a Brochure on ScanWorks
for Agilent Medalist In-Circuit Test, click here.
|
View
Leadership Video