ASSET technologists and product managers present at many trade shows. Here are some of the recent and upcoming presentations, panels and events: Autotestcon Autotestcon 2013 - Schaumburg, IL, September 16-19, 2013 Autotestcon 2012 - Anaheim, CA, September 10-12, 2012, Booth 1238 Pictures of Autotestcon Pictures of Autotestcon Intel® Developers Forum (IDF) IDF 2012 - San Francisco, CA, September 11-13, 2012, Booth #722 Pictures of IDF Pictures of IDF Intel shows new Haswell chips International Test Conference (ITC) ITC 2013 - Anaheim, CA, September 10-13, 2013, Booth 110 ITC 2012 – Anaheim, CA, November 4-9, 2012, Booth 117 "Board Assisted-BIST: Long and Short Term Solutions for Testpoint Erosion - Reaching into the DFx toolbox" by Zoe Conroy, Jmes Grealish, Harrison Miles, Anthony Suto, Al Crouch (ASSET) and Skip Meyers "Are the chip guys helping or hindering board test?" panel session with Al Crouch (ASSET), Harrison Miles, James Grealish, Skip Meyers, Tony Suto, Phil Geiger and David Godlewski Unable to attend. Find out the big buzz at this year's ITC. ITC 2011 – Anaheim, CA, September 19-23, 2011 IEEE Internatonal Workshop on Defect and Adaptive Test Analysis (DATA) DATA 2012 - Anaheim, CA, November 9, 2012 DATA 2011 - Anaheim, CA, September 22-23, 2011 Organizers: Al Crouch, ASSET InterTech Jennifer Dworak, Southern Methodist University Adaptive Test: The European View - Al Crouch, ASSET InterTech - Chair Noise and Reliability - Al Crouch, ASSET InterTech, Chair Top
IEEE VLSI Test Symposium (VTS) VTS 2012 - Maui, HI, April 23-26, 2012 Introduction to FPGA-based Test IP for Protocol-Aware FPGA-based Test - Al Crouch, ASSET InterTech Accessing Embedded Tester IP - Al Courch, ASSET InterTech VTS 2011 - Dana Point, CA, May 1-5, 2011 Why is Access to Embedded Instrumentation so Critical Today - Al Crouch, ASSET InterTech Southwest Design for Test (SWDFT) SWDFT 2013 - Austin, TX, June 6-7, 2013 SWDFT 2012 - Austin, TX, May 2-3, 2012 Al Crouch, ASSET - Sterring/Organizing Committee IEEE North Altantic Test Workshop (NATW) NATW 2012, Boston, MA, May 9-12, 2012 "Test Challenges of 3D-Stacking Structures" - Al Crouch, ASSET InterTech, Panelist "3D Test & Debug Concerns" for panel - Al Crouch, ASSET InterTech Asian Test Symposium (ATS) ATS 2012 - Niigata, Japan, November 19-22, 2012 Test Vision 2020 Test Vision 2020, San Francisco, CA, July 11-12, 2012 "3D Test and Security" by Al Crouch (ASSET) and Jennifer Dworak "P1687 Update" poster by Al Crouch (ASSET) and John Potter (ASSET) Board Test Workshop BTW 2012, Intel, Fort Collins, CO, September 11-13, 2012 Design Automation Conference (DAC) DAC 2013, Austin, Texas, June 2-6, 2013 Test/Diagnose/Debug: Let the 3D-IC Chaos Begin Panelist: Al Crouch (ASSET)
CPU & FPGA Support ScanWorks supports Intel®, ARM®, Freescale™, & other CPUs; Altera®, Xilinx® and Lattice® FPGAs. See the full range